Lattice intrinsic defects and electrical resistivity in pyrite thin films
Source abstract
Abstract
Abstract Electrical resistivity of polycrystalline pyrite thin films has been investigated at 300 K⩽ T ⩽615 K. Curved Arrhenius type plots are interpreted as due to a high density of acceptor states created by interacting Fe vacancies partially compensated by S vacancies. Mean energy value of the narrow band created by those Fe vacancies has been measured as ∼0.11 eV and its standard deviation as ∼0.05 eV. Implications of this view on other properties of the films are discussed.
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Research context
OpenAlex topics: Metal Extraction and Bioleaching · Minerals Flotation and Separation Techniques · Semiconductor materials and interfaces
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