Compositional dependence on the optical properties of amorphous As2−xS3−xSbx thin films
Source abstract
Abstract
Abstract In this paper, we report results of the optical properties of thermally deposited As 2 − x S 3 − x Sb x thin films with x = 0.02, 0.07, 0.1 and 0.15. We have characterized the deposited films by Fourier Transform Infrared, Raman and X-ray photoelectron spectroscopy (XPS). The relationship between the structural and optical properties and the compositional variation were investigated. It was found that the optical bandgap decreases with increase in Sb content. The XPS core level spectra show a decrease in As 2 S 3 percentage with increase in Sb content. This is confirmed from the shifting of the Raman peak from AsS 3 vibrational mode towards SbS 3 vibrational mode.
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Research context
OpenAlex topics: Phase-change materials and chalcogenides · Chalcogenide Semiconductor Thin Films · Glass properties and applications
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References (34)
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