article·2003-05-27

Microstructures of electrodeposited CdS layers

J.M. Nel, H.L. Gaigher, F.D. Auret

Publisher page

Abstract

Cadmium sulfide (CdS) thin films were electrodeposited on two conducting oxide substrates from aqueous solutions at temperatures between 30 and 90 °C. The as-deposited films were characterized using scanning electron microscopy, transmission electron diffraction, atomic force microscopy and Raman spectroscopy and were found to be crystalline at all temperatures. The microstructural development of the films is also discussed based on field emission scanning electron microscopy and atomic force microscopy studies. The composition of the films was found to be independent of the deposition temperature, with a slight difference in the Cd/S ratio on the different substrates.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Chalcogenide Semiconductor Thin Films · Quantum Dots Synthesis And Properties · Copper-based nanomaterials and applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

Reference metadata was not supplied for this record.