RETRACTED: Fractals and superstructures in gadolinia thin film morphology: Influence of process variables on their characteristic parameters
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Source abstract
Abstract
This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal ). This article has been retracted at the request of the Editor-in-Chief. This article has been retracted at the request of the Editor in Chief due to very significant similarity between it and another published article by the same author (“Characterization of microroughness parameters in gadolinium oxide thin films: A study based on extended power spectral density analyses”, by M. Senthilkumar, N. K. Sahoo, S. Thakur, and R.B. Tokas, Applied Surface Science, Vol 252, p1608–1619, April 2005 http://dx.doi.org/10.1016/j.apsusc.2005.02.122 ) and the suspected duplication of data.
Source: expertdata · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Surface Roughness and Optical Measurements · Laser-induced spectroscopy and plasma · Cultural Heritage Materials Analysis
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References
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