Photoluminescence of Eu-doped TiO2 thin films prepared by low pressure hot target magnetron sputtering

Abstract In this work Eu-doped TiO2 thin films prepared by reactive magnetron co-sputtering of Ti–Eu metallic target have been studied. The results of photoluminescence (PL) and its correlation with microstructure have been described. Structural properties were examined by X-ray diffraction (XRD) and Atomic Force Microscopy (AFM). XRD studies have shown that thin films consisted of TiO2-anatase and AFM images display their high quality and dense nanocrystalline structure. PL spectra, measured at room temperature, show a dominating strong red luminescence corresponding to 5D0–7F2 transition at ∼ 617 nm and ∼ 623 nm. The evolution of photoluminescence and microstructure of the thin films has been examined as they were additionally annealed in an air ambient.