article·2000-12-01

Optical constants of zinc sulfide films determined from transmittance measurements

S.M.A. Durrani, A.M. Al-Shukri, Asfaha Iob, E.E. Khawaja

Publisher page

Abstract

The optical constants of thermally evaporated thin films of ZnS have been determined by measurements of transmittance at normal incidence from two films of different thickness. A single-layer model has been successfully used for the films. The results are compared with those obtained earlier for thermally evaporated ZnS films using reflectance and transmittance measurements (where a two-layer model for a ZnS film was used). The advantage of the present method over the earlier one is the readily available measurement facilities.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Quantum Dots Synthesis And Properties · Chalcogenide Semiconductor Thin Films · Phase-change materials and chalcogenides

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

Reference metadata was not supplied for this record.