article·2004-06-09

Room temperature indium tin oxide by XeCl excimer laser annealing for flexible display

Wonsuk Chung, Michael O. Thompson, Paul Wickboldt, D. Toet, P.G. Carey

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Abstract

A XeCl excimer laser (λ=308 nm) has been used to anneal Indium Tin Oxide (ITO) films deposited at 25 °C using DC magnetron sputtering. With increasing laser fluence, the film crystallinity was improved while retaining the as-deposited 〈111〉 texture. As a result of laser irradiation, the sheet resistance of 100 nm ITO films decreased from 191 Ω/□ (1.91×10−3 Ω cm) to 25 Ω/□ (2.5×10−4 Ω cm), while the optical transmittance in the visible range increased from 70% to more than 85%. Surface roughness and etching properties were also significantly improved following laser annealing.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: ZnO doping and properties · Thin-Film Transistor Technologies · Surface Roughness and Optical Measurements

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