article·1999-07-01Open access

Depth dependence of stress and porosity in porous silicon: a micro-Raman study

D. Papadimitriou, J. Bitsakis, J.M. López-Villegas, Josep Samitier, J.R. Morante

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Research context

OpenAlex topics: Silicon Nanostructures and Photoluminescence · Nanowire Synthesis and Applications · Thin-Film Transistor Technologies

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