Determination of optical constants of thin films from transmittance trace
Source abstract
Abstract
Abstract A simple method is depicted in this communication to determine the optical constants of transparent thin films from transmittance versus wavelength traces, showing no fringes, for evaluating thickness. The strength of this technique is apparent when applied to Zn 1 − x Mg x O films.
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Source: openaire · Quality: needs review · Source record ↗
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Research context
OpenAlex topics: ZnO doping and properties · Thin-Film Transistor Technologies · Surface Roughness and Optical Measurements
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