Thermal conductivity of sintered porous silicon films
Source abstract
Abstract
Abstract We measure the thermal diffusivity, thermal conductivity, and the volumetric heat capacity of sintered porous silicon at room temperature using a non-contact method based on lock-in thermography. Free standing single-crystal thin film samples with porosities between 27% and 66% are analyzed. The observed thermal conductivities range from 21 to 2.3 W/(m K) and decrease with increasing porosity. Effective medium theory calculations describe the dependence of the thermophysical properties on the sample porosity.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Thermal properties of materials · Thermal Radiation and Cooling Technologies · Advanced Thermoelectric Materials and Devices
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References (15)
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