Physical properties of thermal coating CdS thin films using a modified evaporation source

Abstract Thin films of CdS on glass substrates have been prepared by a thermal evaporation technique using a modified evaporation source under different preparation conditions. The structural features have been investigated using XRD. The current density–voltage characteristics have been investigated at room temperature with different thicknesses. The results showed ohmic conduction in the lower voltage range and space-charge limited conduction controlled by a single-discrete trapping level for a higher voltage section. Analyses of the results yielded important dependence of film thickness on both the thermally-generated electron concentration and the trapping factor. The optical parameters have been calculated. The dependence of the refractive index, n , and extinction coefficient, k , on the wavelength for a prepared sample is also reported.