article·1990-11-01

Kinetic measurements of oxygen dissolution into niobium substrates: In situ X-ray photoelectron spectroscopy studies

Bretta King, Hitesh Patel, Daniel A. Gulino, Bruce J. Tatarchuk

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OpenAlex topics: Semiconductor materials and devices · Electron and X-Ray Spectroscopy Techniques · Electronic and Structural Properties of Oxides

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