journal article·1995-12Open access

Mechanical measurement of the residual stress in thin PVD films

R.O.E. Vijgen, J.H. Dautzenberg

Thin Solid Films· Volume 270· Issue 1-2

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Metal and Thin Film Mechanics · Diamond and Carbon-based Materials Research · GaN-based semiconductor devices and materials

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References (18)

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