XPS study of CZTSSe monograin powders
Source abstract
Abstract
Abstract The surface and bulk composition of Cu2ZnSn(SexS1-x)4 (CZTSSe) monograin powders were investigated by X-ray photoelectron spectroscopy (XPS). The concentration depth profiling of CZTSSe monograin powders was obtained by Ar+ ion etching. According to the XPS spectra of CZTSSe monograin powder, the binding energies of Zn 2p3/2, Cu 2p3/2, Sn 3d5/2, S 2p3/2 and Se 3d5/2 core levels after surface cleaning are located at 1021.6 eV, 932.4 eV, 486.1 eV, 161.5 eV, 53.9 eV, respectively. From XPS depth profile analysis, Cu deficiency and the excess of chalcogenides on the powder crystals surface were observed.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Chalcogenide Semiconductor Thin Films · Quantum Dots Synthesis And Properties · Semiconductor materials and interfaces
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.