Structural, optical and electrical properties of β-In2S3-3xO3x thin films obtained by PVD
Source abstract
Abstract
β-In2S3−3xO3x thin films have been synthesized following a dry physical process on glass substrates. The highest temperature used during the elaboration of the films is 473 K. The films have been structurally and optically characterized by X-ray diffraction, electronic microprobe analysis, X-ray photoelectron spectroscopy, scanning electronic microscopy and atomic force microscopy. They crystallize in the tetragonal β-In2S3 structure. Their optical band gap varies from 2.1 eV, when they are pure β-In2S3, to 2.9 eV when they contain 8.5 at.% of oxygen. The electrical properties of the thin films have also been determined, they have n-type electrical conductivity of approximately 10−3 S·cm−1. All these properties make β-In2S3−3xO3x thin films good candidates to substitute CBD-CdS as buffer layer in CIGS-based solar cells.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Chalcogenide Semiconductor Thin Films · Quantum Dots Synthesis And Properties · Semiconductor materials and interfaces
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