article·1989-03-01

Morphology and structure of TiO2 thin layers vs. thickness and substrate temperature

M. Lottiaux, C. Boulesteix, G. Nihoul, F. Varnier, F. Flory, R. Galindo, E. Pelletier

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OpenAlex topics: Surface Roughness and Optical Measurements · ZnO doping and properties · Advanced Sensor Technologies Research

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