Protection of polymer from atomic-oxygen erosion using Al2O3 atomic layer deposition coatings
Source abstract
Abstract
Abstract Thin films of Al 2 O 3 grown using atomic layer deposition (ALD) techniques can protect polymers from erosion by oxygen atoms. To quantify this protection, polyimide substrates with the same chemical repeat unit as Kapton ® were applied to quartz crystal microbalance (QCM) sensors. Al 2 O 3 ALD films with varying thicknesses were grown on the polyimide substrates. The ALD-coated polyimide materials were then exposed to a hyperthermal atomic-oxygen beam. The mass loss versus oxygen-atom exposure time was measured in situ by the QCM. Al 2 O 3 ALD film thicknesses of ∼ 35 A were found to protect the polymer from erosion.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Semiconductor materials and devices · Analytical Chemistry and Sensors · Diamond and Carbon-based Materials Research
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.