article·2007-07-22

Protection of polymer from atomic-oxygen erosion using Al2O3 atomic layer deposition coatings

Russell Cooper, Hari P. Upadhyaya, Timothy K. Minton, Michael R. Berman, Xiaohua Du, Steven M. George

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Abstract

Abstract Thin films of Al 2 O 3 grown using atomic layer deposition (ALD) techniques can protect polymers from erosion by oxygen atoms. To quantify this protection, polyimide substrates with the same chemical repeat unit as Kapton ® were applied to quartz crystal microbalance (QCM) sensors. Al 2 O 3 ALD films with varying thicknesses were grown on the polyimide substrates. The ALD-coated polyimide materials were then exposed to a hyperthermal atomic-oxygen beam. The mass loss versus oxygen-atom exposure time was measured in situ by the QCM. Al 2 O 3 ALD film thicknesses of ∼ 35 A were found to protect the polymer from erosion.
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Research context

OpenAlex topics: Semiconductor materials and devices · Analytical Chemistry and Sensors · Diamond and Carbon-based Materials Research

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