article·1998-02-01

Development of a parametric optical constant model for Hg1−xCdxTe for control of composition by spectroscopic ellipsometry during MBE growth

Blaine Johs, Craig M. Herzinger, J. H. Dinan, A. Cornfeld, J. D. Benson

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OpenAlex topics: Advanced Semiconductor Detectors and Materials · Chalcogenide Semiconductor Thin Films · Semiconductor Quantum Structures and Devices

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