journal article·2024-10-08Open access

Shear Anisotropy Domains on Graphene Revealed by In-Plane Elastic Imaging

Chengfu Ma, Yaping Li, Chenggang Zhou, Yuhang Chen, Enrico Gnecco, Jiaru Chu

ACS Nano· Volume 18· Issue 40

Abstract

Anisotropic domains with 180° periodicity are known to be universally present on graphene as well as on other two-dimensional (2D) crystals. The physical origin of the domains and the mechanism of its anisotropy are, however, still unclear. Here, by employing in-plane elastic imaging by torsional resonance atomic force microscopy (TR-AFM), we demonstrate that the observed domains on graphene are of in-plane elastic (shear) anisotropy but not of friction anisotropy as commonly believed. Our results also support that the anisotropic domains originate from self-assembled environmental adsorbates on graphene surfaces. The more densely packed backbone of the highly ordered molecules within a domain defines the major axis of the shear anisotropy of the latter. This work suggests a quantitative understanding of the characteristics of anisotropic domains on 2D materials. It also demonstrates TR-AFM as a powerful tool to study the in-plane elastic anisotropy of materials, including organic molecular crystals.
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Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Advanced Electron Microscopy Techniques and Applications · Advanced Surface Polishing Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei 230026, China

State Key Laboratory of Solid Lubrication, Lanzhou Institute of Chemical Physics, Chinese Academy of Sciences, Lanzhou 730000, China

Center for Micro- and Nanoscale Research and Fabrication, Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei 230026, China

Marian Smoluchowski Institute of Physics, Jagiellonian University, Krakow 30-348, Poland

Funding

Narodowe Centrum Nauki · Uniwersytet Jagiellonski w Krakowie · National Natural Science Foundation of China · Chinese Academy of Sciences

References (43)

Show source-provided references
1. 10.1016/j.wear.2016.04.01910.1016/j.wear.2016.04.019 ↗
2. 10.1016/S1748-0132(07)70140-810.1016/S1748-0132(07)70140-8 ↗
3. 10.1103/PhysRevLett.56.93010.1103/PhysRevLett.56.930 ↗
4. 10.1103/PhysRevLett.59.194210.1103/PhysRevLett.59.1942 ↗
5. 10.1021/cr960068q10.1021/cr960068q ↗
6. 10.1016/j.mattod.2013.12.00310.1016/j.mattod.2013.12.003 ↗
7. 10.1021/acs.langmuir.3c0154610.1021/acs.langmuir.3c01546 ↗
8. 10.1126/science.120711010.1126/science.1207110 ↗
9. 10.1038/ncomms1074510.1038/ncomms10745 ↗
10. 10.1038/s41427-018-0098-210.1038/s41427-018-0098-2 ↗
11. 10.1021/acs.jpcc.1c0117910.1021/acs.jpcc.1c01179 ↗
12. 10.1007/s40544-021-0517-110.1007/s40544-021-0517-1 ↗
13. 10.1063/1.473742810.1063/1.4737428 ↗
14. 10.1038/srep0726310.1038/srep07263 ↗
15. 10.1038/s41699-020-00164-210.1038/s41699-020-00164-2 ↗
16. 10.1021/acs.nanolett.8b0034810.1021/acs.nanolett.8b00348 ↗
17. 10.1002/adma.1996008090410.1002/adma.19960080904 ↗
18. 10.1002/adfm.20050081610.1002/adfm.200500816 ↗
19. 10.1002/adma.20080183410.1002/adma.200801834 ↗
20. 10.1103/PhysRevLett.104.08610210.1103/PhysRevLett.104.086102 ↗
21. 10.1039/c7nr01116d10.1039/c7nr01116d ↗
22. 10.1021/acsmacrolett.1c0060310.1021/acsmacrolett.1c00603 ↗
23. 10.1103/PhysRevLett.105.16610310.1103/PhysRevLett.105.166103 ↗
24. 10.1088/0022-3727/38/18/R0110.1088/0022-3727/38/18/R01 ↗
25. 10.1063/1.187657610.1063/1.1876576 ↗
26. 10.1063/1.276738710.1063/1.2767387 ↗
27. 10.1143/JJAP.36.437710.1143/JJAP.36.4377 ↗
28. 10.1021/acs.langmuir.2c0331810.1021/acs.langmuir.2c03318 ↗
29. 10.1021/acs.macromol.8b0117810.1021/acs.macromol.8b01178 ↗
30. 10.1063/5.001904210.1063/5.0019042 ↗
31. 10.1063/1.11863910.1063/1.118639 ↗
32. 10.1038/nmat338610.1038/nmat3386 ↗
33. 10.1021/la301671a10.1021/la301671a ↗
34. 10.1021/nn403988y10.1021/nn403988y ↗
35. 10.1039/c8cp01039k10.1039/c8cp01039k ↗
36. 10.1016/j.carbon.2018.10.09410.1016/j.carbon.2018.10.094 ↗
37. 10.1016/j.carbon.2022.08.00510.1016/j.carbon.2022.08.005 ↗
38. 10.1002/adma.20110202210.1002/adma.201102022 ↗
39. 10.1038/s41467-022-34641-710.1038/s41467-022-34641-7 ↗
40. 10.1126/science.110289610.1126/science.1102896 ↗
41. 10.1016/j.carbon.2008.06.02210.1016/j.carbon.2008.06.022 ↗
42. 10.1063/1.114397010.1063/1.1143970 ↗
43. Su, C.; Huang, L.; Prater, C. B.; Bhushan, B. Applied Scanning Probe Methods V, edited by Bhushan, B.; Kawata, S.; Fuchs, H. Springer: Berlin, Heidelberg, 2007, pp 113–148.10.1007/978-3-540-37316-2_6 ↗