journal article·2011-10

An intelligent model for detecting and classifying color-textured fabric defects using genetic algorithms and the Elman neural network

YH Zhang, CWM Yuen, WK Wong, Chi-wai Kan

Textile Research Journal· Volume 81· Issue 17
Publisher page

Abstract

In this paper, an intelligent color-textured fabric defect detection and classification model using genetic algorithms and the Elman neural network is introduced. A color ring projection is used for image processing, and the solution for optimization of parameters is based on the genetic algorithm method. The new modified Elman network is proposed to classify the type of fabric defects, which have proportional, integral, and derivative properties. The proposed inspecting model in this study is more feasible and applicable in fabric and stitching garment defect detection and classification.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Industrial Vision Systems and Defect Detection · Textile materials and evaluations · Surface Roughness and Optical Measurements

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Institute of Textiles and Clothing, The Hong Kong Polytechnic University, Hong Kong

Institute of Textiles and Clothing, The Hong Kong Polytechnic University, Hong Kong,

References (32)

Show source-provided references
1. Dorrity JL · Nat Textil Center Annu Rep · 1994 · 20 · 193
2. Munden L. · Textil Asia · 1988 · 19 · 85
3. 10.1177/00405175000700120710.1177/004051750007001207 ↗
4. 10.1117/12.36026610.1117/12.360266 ↗
5. 10.1016/0262-8856(96)84491-X10.1016/0262-8856(96)84491-X ↗
6. 10.1016/j.patrec.2003.08.00510.1016/j.patrec.2003.08.005 ↗
7. Kumar A.
8. 10.1016/0031-3203(91)90143-S10.1016/0031-3203(91)90143-S ↗
9. 10.1016/S0031-3203(98)00130-710.1016/S0031-3203(98)00130-7 ↗
10. 10.1109/34.46455910.1109/34.464559 ↗
11. 10.1016/j.eswa.2007.02.03210.1016/j.eswa.2007.02.032 ↗
12. 10.1117/12.24853710.1117/12.248537 ↗
13. 10.1109/3477.86518010.1109/3477.865180 ↗
14. 10.1177/004051750505920910.1177/0040517505059209 ↗
15. 10.1177/00405175960660071010.1177/004051759606600710 ↗
16. 10.1016/S0262-8856(03)00003-910.1016/S0262-8856(03)00003-9 ↗
17. 10.1016/j.patcog.2004.07.00910.1016/j.patcog.2004.07.009 ↗
18. 10.1016/j.eswa.2007.12.00910.1016/j.eswa.2007.12.009 ↗
19. 10.1177/00405175000700071210.1177/004051750007000712 ↗
20. 10.1109/41.74441510.1109/41.744415 ↗
21. 10.1016/0031-3203(93)90102-310.1016/0031-3203(93)90102-3 ↗
22. 10.1109/82.71882410.1109/82.718824 ↗
23. Tan SC
24. 10.2115/fiber.50.12_59310.2115/fiber.50.12_593 ↗
25. 10.1177/00405175950650010110.1177/004051759506500101 ↗
26. 10.1533/joti.2004.005710.1533/joti.2004.0057 ↗
27. Bounsaythip C.
28. 10.1207/s15516709cog1402_110.1207/s15516709cog1402_1 ↗
29. 10.1109/72.27919310.1109/72.279193 ↗
30. Cheng YC · IEEE Conf Cybern Intell · 2008 · 70 · 971
31. Wong WK · Expert Syst Appl · 2009 · 36 · 384510.1016/j.eswa.2008.02.066 ↗
32. 10.1177/004051750605390610.1177/0040517506053906 ↗