An intelligent model for detecting and classifying color-textured fabric defects using genetic algorithms and the Elman neural network
Source abstract
Abstract
In this paper, an intelligent color-textured fabric defect detection and classification model using genetic algorithms and the Elman neural network is introduced. A color ring projection is used for image processing, and the solution for optimization of parameters is based on the genetic algorithm method. The new modified Elman network is proposed to classify the type of fabric defects, which have proportional, integral, and derivative properties. The proposed inspecting model in this study is more feasible and applicable in fabric and stitching garment defect detection and classification.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Industrial Vision Systems and Defect Detection · Textile materials and evaluations · Surface Roughness and Optical Measurements
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Institute of Textiles and Clothing, The Hong Kong Polytechnic University, Hong Kong
Institute of Textiles and Clothing, The Hong Kong Polytechnic University, Hong Kong,
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