Fabric defect image generation method based on the dual-stage W-net generative adversarial network
Abstract
Research context
OpenAlex topics: Industrial Vision Systems and Defect Detection · Integrated Circuits and Semiconductor Failure Analysis · Image Processing Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
College of Physics Science and Technology, Guangxi Normal University, China
Sino-German College of Intelligent Manufacturing, Shenzhen Technology University, China
Graduate School, Shenzhen Technology University, China
Three-dimensional Perception Laboratory, Shenzhen University of Technology, China
College of Health and Environmental Engineering, Shenzhen Technology University, China
Funding
Shenzhen Natural Science Foundation General Project · the Guangdong Provincial Key Areas Special Project · the Self-made Instrument Project of Shenzhen Technology University · Guangdong provincial demonstration base project for joint cultivation of postgraduate students, “Shenzhen Libang Precision Instrument Co., Ltd.” · Shenzhen Pingshan District Science and technology innovation special supporting project