A defect detection method for unpatterned fabric based on multidirectional binary patterns and the gray-level co-occurrence matrix
Source abstract
Abstract
A new texture-feature description operator, called the multidirectional binary patterns (MDBP) operator, is proposed in this paper. The operator can extract the detailed distribution of textures in local regions by comparing the differences in the gray levels between neighboring pixels. Moreover, the texture expression ability is enhanced by focusing on the texture features in the linear neighborhood of the image in multiple directions. The MDBP operator was modified by introducing a “uniform” pattern to reduce the grayscale values in the image. Combining the “uniform” MDBP operator and the gray-level co-occurrence matrix, an unpatterned fabric-defect detection scheme is proposed, including texture-feature extraction and detection stages. In the first stage, the multidirectional texture-feature matrix of a nondefective fabric image is extracted, and then the detection threshold is determined based on the similarity between the feature matrices. In the second stage, the defect is detected with the detection threshold. The proposed method is adapted to various grayscale textile images with different characteristics and is robust to a wide variety of image-processing operations. In addition, it is invariant to grayscale changes, performs well when representing textures and detecting defects and has lower computational complexity than other methods.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Industrial Vision Systems and Defect Detection · Image Processing Techniques and Applications · Image and Object Detection Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
School of Computer Science and Technology, Donghua University, China
References (35)
Show source-provided references
1. 10.1006/rtim.2001.023110.1006/rtim.2001.0231 ↗
2. Tajeripour F · EURASIP J Adv Signal Process · 2008 · 2008 · 1
3. 10.1109/TIE.2005.85164810.1109/TIE.2005.851648 ↗
4. 10.1364/AO.46.00668810.1364/AO.46.006688 ↗
5. Li PF, Zhao Z, Zhang L, et al. The real-time vision system for fabric defect detection with combined approach. In: international conference on image and graphics (ed Yu-Jin Zhang), Tianjin, China, 13–16 August 2015, paper no. LNCS 9219, pp.460–473. Cham: Springer.10.1007/978-3-319-21969-1_41 ↗
6. 10.1109/TSMC.1973.430931410.1109/TSMC.1973.4309314 ↗
7. 10.1109/TPAMI.1979.476692110.1109/TPAMI.1979.4766921 ↗
8. 10.1504/IJCVR.2011.04526710.1504/IJCVR.2011.045267 ↗
9. Arnia F and Munadi K. Real time textile defect detection using GLCM in DCT-based compressed images. In: international conference on modeling, simulation and applied optimization (eds Ismail Kucuk, Faruk Yigit and Aydin Yesildirek), Istanbul, Turkey, 27–29 May 2015, paper no. ICMSAO.2015.7152203, pp. 1–6. Turkey: IEEE.10.1109/ICMSAO.2015.7152203 ↗
10. 10.1016/S0262-8856(99)00062-110.1016/S0262-8856(99)00062-1 ↗
11. 10.1016/j.patcog.2015.09.02210.1016/j.patcog.2015.09.022 ↗
12. Kang XJ · Text Res J · 2019 · 0 · 1
13. 10.1109/34.8567010.1109/34.85670 ↗
14. Ozdemir S and Ercil A. Markov random fields and Karhunen-Loeve transforms for defect inspection of textile products. In: proceedings of the 1996 IEEE conference on emerging technologies and factory automation (ed Hubert Wo), Kauai, USA, 18–21 November 1996, paper no. ETFA.1996.573989, pp. 697–703. Piscataway: IEEE.10.1109/ETFA.1996.573989 ↗
15. 10.1177/004051751348562910.1177/0040517513485629 ↗
16. Hajimowlana SH, Muscedere R, Jullien GA, et al. 1D autoregressive modeling for defect detection in web inspection systems. In: Midwest symposium on circuits and systems (ed Joseph Daigle), Notre Dame, USA, 9–12 August 1998, paper no. MWSCAS.1998.759496, pp. 318–321. Piscataway: IEEE.10.1109/MWSCAS.1998.759496 ↗
17. 10.1109/28.87127410.1109/28.871274 ↗
18. 10.1109/28.99316410.1109/28.993164 ↗
19. Beirão CL and Figueiredo MAT. Defect detection in textile images using Gabor filters. In: 1st international conference on image analysis and recognition (eds Aurélio Campilho and Mohanmed Kamel), Porto, Portugal, 29 September–1 October 2004, paper no. LNCS 2312, pp.841–848. Berlin: Springer.10.1007/978-3-540-30126-4_102 ↗
20. 10.1007/s00138-005-0007-x10.1007/s00138-005-0007-x ↗
21. Kuo CFJ · Text Res J · 2015 · 0 · 1
22. 10.1177/004051751455579610.1177/0040517514555796 ↗
23. Ojala T, Pietikäinen M and Mäenpää T. Gray scale and rotation invariant texture classification with local binary patterns. In: 6th European conference on computer vision (ed David Vernon), Dublin, Ireland, 26 June–1 July 2000, paper no. LNCS 1842, pp. 404–420. Berlin: Springer.10.1007/3-540-45054-8_27 ↗
24. 10.1109/TIP.2009.201568210.1109/TIP.2009.2015682 ↗
25. Guo ZH, Zhang L, Zhang D, et al. Rotation invariant texture classification using adaptive LBP with directional statistical features. In: 2010 IEEE international conference on image processing (eds Bonnie Law), Hong Kong, China, 26–29 September 2010, paper no. ICIP.2010.5652209, pp. 285–288. Piscataway: IEEE.10.1109/ICIP.2010.5652209 ↗
26. 10.1109/TIP.2010.204495710.1109/TIP.2010.2044957 ↗
27. Hamouchene I and Aouat S. A cognitive approach for texture analysis using neighbors-based binary patterns. In: 13th IEEE international conference on cognitive informatics and cognitive computing (eds Patel S, Wang Y, Kinsner W, et al.), London, UK, 18–20 August 2014, paper no. ICCI-CC 6921447, pp. 94–99. Piscataway: IEEE.10.1109/ICCI-CC.2014.6921447 ↗
28. 10.1016/j.patcog.2016.08.03210.1016/j.patcog.2016.08.032 ↗
29. 10.1007/s11042-017-5440-010.1007/s11042-017-5440-0 ↗
30. 10.1177/004051751244433210.1177/0040517512444332 ↗
31. 10.1016/S0031-3203(03)00005-010.1016/S0031-3203(03)00005-0 ↗
32. 10.1177/004051751347845110.1177/0040517513478451 ↗
33. Kang ZQ, Yuan CH and Qian Y. The fabric defect detection technology based on wavelet transform and neural network convergence. In: 2013 IEEE international conference on information and automation (eds Gu J, Hu C and Li B), Yinchuan, China, 26–28 August 2013, paper no. ICInfA 6720367, pp. 697–703. Piscataway: IEEE.10.1109/ICInfA.2013.6720367 ↗
34. Wei B, Hao KR, Tang XS, et al. Fabric defect detection based on faster R-CNN. In: international conference on artificial intelligence on textile and apparel (ed Wai Keung Wong), Hong Kong, China, 3–6 July 2018, paper no. AISC volume 849, pp. 45–51. Cham: Springer.10.1007/978-3-319-99695-0_6 ↗
35. 10.3390/s1804106410.3390/s18041064 ↗