journal article·2022-07-26

Low-Dose Sparse-View HAADF-STEM-EDX Tomography of Nanocrystals Using Unsupervised Deep Learning

Eunju Cha, Hyungjin Chung, Jaeduck Jang, Junho Lee, Eunha Lee, Jong Chul Ye

ACS Nano· Volume 16· Issue 7
Publisher page

Abstract

High-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) can be acquired together with energy dispersive X-ray (EDX) spectroscopy to give complementary information on the nanoparticles being imaged. Recent deep learning approaches show potential for accurate 3D tomographic reconstruction for these applications, but a large number of high-quality electron micrographs are usually required for supervised training, which may be difficult to collect due to the damage on the particles from the electron beam. To overcome these limitations and enable tomographic reconstruction even in low-dose sparse-view conditions, here we present an unsupervised deep learning method for HAADF-STEM-EDX tomography. Specifically, to improve the EDX image quality from low-dose condition, a HAADF-constrained unsupervised denoising approach is proposed. Additionally, to enable extreme sparse-view tomographic reconstruction, an unsupervised view enrichment scheme is proposed in the projection domain. Extensive experiments with different types of quantum dots show that the proposed method offers a high-quality reconstruction even with only three projection views recorded under low-dose conditions.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Digital Holography and Microscopy · Advanced Electron Microscopy Techniques and Applications · Advanced X-ray Imaging Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Samsung Advanced Institute of Technology, Samsung Electronics, Gyeonggi-do 16678, Republic of Korea

Department of Bio and Brain Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Republic of Korea

Kim Jae Chul Graduate School of AI, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Republic of Korea

Funding

Samsung Advanced Institute of Technology

References (33)

Show source-provided references
1. Goldstein J. I. · 2017
2. 10.1016/j.ultramic.2016.12.00810.1016/j.ultramic.2016.12.008 ↗
3. 10.1017/S143192761800243X10.1017/S143192761800243X ↗
4. Kametani K. · Ann. Microsc. · 2008 · 8 · 45
5. 10.1126/science.271.5251.93310.1126/science.271.5251.933 ↗
6. 10.1103/PhysRevA.57.12010.1103/PhysRevA.57.120 ↗
7. 10.1016/j.ultramic.2015.10.00710.1016/j.ultramic.2015.10.007 ↗
8. Cuturi M. · Advances in neural information processing systems · 2013 · 26
9. Kingma D. P. · 2014
10. Kingma D. P. · 2018
11. Goodfellow I. · 2014 · 2672
12. 10.1109/TCI.2020.300673510.1109/TCI.2020.3006735 ↗
13. 10.1109/TCI.2020.301856210.1109/TCI.2020.3018562 ↗
14. 10.1109/TMI.2020.302362010.1109/TMI.2020.3023620 ↗
15. 10.1109/TCI.2021.309893710.1109/TCI.2021.3098937 ↗
16. Villani C. · 2009 · 33810.1007/978-3-540-71050-9 ↗
17. 10.1561/220000007310.1561/2200000073 ↗
18. 10.1038/s42256-020-00289-510.1038/s42256-020-00289-5 ↗
19. 10.1137/20M131799210.1137/20M1317992 ↗
20. 10.1016/0022-5193(72)90180-410.1016/0022-5193(72)90180-4 ↗
21. 10.1016/j.ultramic.2013.03.01910.1016/j.ultramic.2013.03.019 ↗
22. 10.1016/j.ultramic.2012.07.00310.1016/j.ultramic.2012.07.003 ↗
23. 10.1039/C8NR09058K10.1039/C8NR09058K ↗
24. 10.1016/j.ultramic.2018.04.01110.1016/j.ultramic.2018.04.011 ↗
25. 10.1039/D1NR03232A10.1039/D1NR03232A ↗
26. Cha E. · arXiv · 2019 · 1906.07330
27. 10.1016/j.ultramic.2018.04.00810.1016/j.ultramic.2018.04.008 ↗
28. 10.1109/TIP.2007.90123810.1109/TIP.2007.901238 ↗
29. 10.1364/OL.33.00015610.1364/OL.33.000156 ↗
30. 10.1561/220000001610.1561/2200000016 ↗
31. Shewchuk, J. R. An introduction to the conjugate gradient method without the agonizing pain. 1994; https://dl.acm.org/doi/10.5555/865018 (accessed 2022-06-10).
32. 10.1137/04060541210.1137/040605412 ↗
33. 10.1016/j.ultramic.2015.05.00210.1016/j.ultramic.2015.05.002 ↗