A diffractive gloss meter for local gloss measurements of papers and prints
Source abstract
Abstract
Specular gloss is widely used in the paper industry to assess surface quality. Although specular gloss is defined as the ratio of light fluxes from the inspected surface and a reference surface, the measurement of minute changes in local gloss has not been presented in international standards due to the lack of suitable gloss meters. Our studies of local and average gloss from papers and prints using a highly sensitive diffractive gloss meter (DOG) yielded information on local and global gloss that can help papermakers in the research and development of optimal paper surface quality, which is crucial in obtaining optimal print quality.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Material Properties and Processing · Surface Roughness and Optical Measurements · Industrial Vision Systems and Defect Detection
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (21)
Show source-provided references
1. Wagberg, P. and Johanson, P.-Å., Tappi J. 76(12): 115(1993).
2. Gate, L., Windle, W., and Hine, M., Tappi J. 56(3): 61(1973).
3. Beckmann, P. and Spizzichino, A., The Scattering of Electromagnetic Waves from Rough Surfaces Pergamon, Oxford, United Kingdom, 1963.
4. Glatter, T. and Bousfield, D.W., Tappi J. 80(7): 125(1997).
5. Desjumaux, D., Bousfield, D.W., Glatter, T.P., et al., J.Pulp & Paper Sci. 24(5): 150(1998).
6. Preston, J.S., Elton, N.J., Husband, J.C., et al., Colloids and Surfaces A: Physicochem. Eng. Aspects 205(3): 183(2002).10.1016/S0927-7757(02)00020-1 ↗
7. Myller, K., Peiponen, K.-E., and Silvennoinen, R., Opt. Eng. 42(11): 3194 (2003).10.1117/1.1614263 ↗
8. Silvennoinen R., Myller, K., Peiponen, K.-E., et al., Sensors & Actuators A. 112(1): 74(2004).10.1016/j.sna.2003.12.016 ↗
9. Peiponen, K.-E., Alarousu, E., Juuti, M., et al., Opt. Eng. 45(4):43601(2006).10.1117/1.2188963 ↗
10. Juuti, M., Prykäri, T., Alarousu, E., et al., Colloids and Surfaces A: Physicochem. Eng. Aspects, 299(1-3): 101(2007).10.1016/j.colsurfa.2006.11.039 ↗
11. Peiponen, K.-E. and Juuti, M., Appl. Phys. Lett. 88(7): 711041(2006).10.1063/1.2173262 ↗
12. Myller, K., Juuti, M., Peiponen, K.-E., et al., Precis. Eng. 30(4): 443(2006).10.1016/j.precisioneng.2005.11.009 ↗
13. Juuti, M., Peiponen, K.-E., Obraztsov, A.N., et al., Opt. Materials 29(12): 1719(2007).10.1016/j.optmat.2006.09.017 ↗
14. Silvennoinen, R., Peiponen, K.-E., and Asakura, T., in International Trends in Optics and Photonics ICO IV, Asakura, T., Ed., Springer, Berlin, Germany, 1999, pp. 281- 293.10.1007/978-3-540-48886-6_18 ↗
15. Collier, R.J., Burckhardt, C.B., and Lin L.W., Optical Holography, Academic Press, New York, United States, 1971.10.1016/B978-0-12-181050-4.50022-6 ↗
16. Nieto-Vesperinas, M., Scattering and Diffraction in Physical Optics, Wiley, New York, United States, 1991.
17. Savolainen, M., Räsänen, J., Peiponen, K.-E. et al., Opt. Eng. 35(12): 3637(1996).10.1117/1.601082 ↗
18. Erf ,R.K., Ed., Speckle Metrology Academic Press, Orlando, Florida, United States, 1978.
19. Juuti, M., Kalima, V., Pakkanen, T.T., et al., Meas. Sci. Technol. 18(5): L5(2007).10.1088/0957-0233/18/5/L01 ↗
20. Oksman, A., Juuti, M. and Peiponen, K.-E., Meas. Sci. Technol. 18(7): 2185(2007).10.1088/0957-0233/18/7/050 ↗
21. Born, M. and Wolf , E., Principles of Optics, 7th edn., Cambridge University Press, United Kingdom, 1999.