journal article·1987-03

Charge-density waves in layered chalcogenides observed by scanning tunneling microscopy

R.V. Coleman, W.W. McNairy, C.G. Slough, P.K. Hansma, B. Drake

Synthetic Metals· Volume 19· Issue 1-3
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Abstract

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Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Molecular Junctions and Nanostructures · Semiconductor materials and interfaces

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References (11)

Show source-provided references
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7. J. Tersoff, to be published.
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11. Drake · Rev. of Sci. Inst. · 1986 · 57 · 44110.1063/1.1139208 ↗