journal article·2020-12Open access

EFFECT OF Sn INCORPORATION ON STRUCTURAL, PHYSICAL AND ELECTRICAL PROPERTIES OF Ge-Se-Sb-Sn THIN FILMS

Center of advanced study in Physics, Department of Physics, Panjab University, Chandigarh, India, 160014, J. KANG, R. K. KOTNALA, CSIR-National Physical Laboratory, Dr. K. S. Krishnan Road, New Delhi, India, 110012, S. K. TRIPATHI, Center of advanced study in Physics, Department of Physics, Panjab University, Chandigarh, India, 160014

Chalcogenide Letters· Volume 17· Issue 12

Abstract

The present work reports the analysis of physical, structural and electrical properties alongwiththeir compositional dependence for (Ge20Se80)90-xSb10Snx (x = 2, 4, 6, 10 at %) chalcogenide glassy system. XRDspectra show the amorphous nature of the prepared samples with the possibility of short-range ordering in the samples. Chemically ordered network model, consistent with (8− N) rule, has been utilizedin estimating various physical parameters which reveals that Ge-Se-Sb-Sn glassy systems are thermally stable glasses. The current transport mechanisms have been investigated as a function of temperature in the temperature range 293 K− 363 K revealing thatthe dc-conduction occurs through an activated process with single activation energy. Meyer-Neldel rule is found to be obeyed. The present study suggests Ge-Se-Sb-Sn glassy system to be an optimal material for utilization in optical devices.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Phase-change materials and chalcogenides · Glass properties and applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

Reference metadata was not supplied for this record.