journal article·2025-03-03Open access

Morphological study of bulk sample averse to thin films for a quaternary glassy alloy system

Department of Applied Sciences, The North Cap University, Gurugram, India, P. Kaushik, A. Devi, Department of Applied Sciences, Amity University, Gurugram, India, H. Singh, Department of Applied Sciences, The North Cap University, Gurugram, India

Chalcogenide Letters· Volume 22· Issue 3

Abstract

The structural properties of bulk as well as thin films of nanostructured Bi1Te15Se84-x Pbx (0 ≤ x ≤ 8) glassy alloys has been studied in this paper. Conventional melt quenching method is employed to prepare the samples of Bi1Te15Se84-x Pbx (0 ≤ x ≤ 8) alloys. Thin films with thickness of approximately 158nm of the obtained bulk compositions were deposited on dry cleaned glass substrates by thermal evaporation technique. The structural characterization was carried out using XRD and SEM. Energy dispersive X-ray spectroscopy (EDX) indicates that samples are nearly stoichiometric. X-ray diffraction patterns indicate that they are in the crystalline state. SEM study indicates the formation of snow flaky structures with agglomeration with the rise in lead content in the sample. Raman spectroscopy is used to study how changes in composition due to Pb doping affect lattice vibrations and electronphonon interactions.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Metallic Glasses and Amorphous Alloys · Surface Roughness and Optical Measurements · Glass properties and applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (20)

Show source-provided references
1. [1] M.A. Majeed Khan, M. Wasi Khan, Mansour Alhoshan, J. Materials Letters (2010);64: 1929-1932; https://doi.org/10.1016/j.matlet.2010.05.03310.1016/j.matlet.2010.05.033 ↗
2. [2] Deepika, H. Singh, J. Infrared Physics & Technology (2017);85:39-43; https://doi.org/10.1016/j.infrared.2017.05.01410.1016/j.infrared.2017.05.014 ↗
3. [3] M. S. Kamboj, R. Thangaraj, J. Eur. Phys. J. Appl.Phys. (2003);24: 33-36; https://doi.org/10.1051/epjap:200305210.1051/epjap:2003052 ↗
4. [4] N.B. Maharjan, D. Bhandari, N.S. Saxena, J. Material Sci. (2000);23:369-376.
5. [5] S.B. Bhanu Prashanth, S. Asokan, J. Non-Cryst. Solids (2009); 355:164-168; https://doi.org/10.1016/j.jnoncrysol.2008.11.00310.1016/j.jnoncrysol.2008.11.003 ↗
6. [6] J. Jing, A. Kramer, R. Birringer, H. Gleiter, J. Non-Crystalline Solids (1989);113:167-170; https://doi.org/10.1016/0022-3093(89)90007-010.1016/0022-3093(89)90007-0 ↗
7. [7] H. Gleiter, J. Nanotechnol. (2013); 4:517-533; https://doi.org/10.3762/bjnano.4.6110.3762/bjnano.4.61 ↗
8. [8] A. Sharma, P.B. Barman, J. Physica B: Condens. Matter (2010); 822-827.
9. [9] N Suri, P K Khanna, R Thangraj, Journal of Optoelectronic Advanced Materials (2009); 794
10. [10] N Suri, K S Bindra, M Ahmad,J. Applied Physics A (2008), 149; https://doi.org/10.1007/s00339-007-4242-z10.1007/s00339-007-4242-z ↗
11. [11] H Wang, N Madaan, J A Bagley Diwan, Y Liu, R C Davis, J.Thin Solid Films(2014);124; https://doi.org/10.1016/j.tsf.2014.08.02610.1016/j.tsf.2014.08.026 ↗
12. [12] M.A Alvi, J. Superlattices and Microstructures (2014);73 1; https://doi.org/10.1016/j.spmi.2014.05.00410.1016/j.spmi.2014.05.004 ↗
13. [13] A. Sharma, P.B. Barman, J. Philos. Mag. (2010); 2149-2159;https://doi.org/10.1080/1478643100363081910.1080/14786431003630819 ↗
14. [14] A. Sharma, P.B. Barman, J. Thin Solid Films (2009); 3020-3023; https://doi.org/10.1016/j.tsf.2008.11.12310.1016/j.tsf.2008.11.123 ↗
15. [15] N.F. Mott, J. Philos. Mag., (1969);835-852; https://doi.org/10.1080/1478643690821633810.1080/14786436908216338 ↗
16. [16] N.F. Mott, E.A. Davis, J. Philos. Mag (1970),903-922.
17. [17] N.F. Mott, E.A. Davis, J. Clarendon, Oxford, (1970).
18. [18] Deepika, H. Singh, J. Nanostruct. Nano-objects, (2017),192.
19. [19] Deepika, H. Singh, J. MAPAN 33 Metrol. Soc. Ind(2018);165-168; https://doi.org/10.1007/s12647-017-0240-610.1007/s12647-017-0240-6 ↗
20. [20] Deepika, H. Singh, N.S. Saxena, J. Mater. Res. Express, (2017) 035203.