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journal article·2024-05-15Open access

Properties of X-ray diffraction and Raman scattering in PbSe, PbS and PbS0,5Se0,5 thin films

The Ministry of Science and Education of Azerbaijan, Institute of NaturalResources, H.Aliyev ave. 76, AZ7000, Nakhchivan,Baku, Azerbaijan, S.N. Yasinova, S.I. Mekhtiyeva, The Ministry of Science and Education of Azerbaijan, Institute of Physics named after Academician Hasan Abdullayev,G. Javid ave 131, AZ1143. Baku, Azerbaijan, M.H. Huseynaliyev, The Ministry of Science and Education of Azerbaijan, Institute of NaturalResources, H.Aliyev ave. 76, AZ7000, Nakhchivan,Baku, Azerbaijan, R.I. Alekberov, The Ministry of Science and Education of Azerbaijan, Institute of Physics named after Academician Hasan Abdullayev,G. Javid ave 131, AZ1143. Baku, Azerbaijan

Chalcogenide Letters· Volume 21· Issue 5
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Abstract

Structural properties of PbSe, PbS and PbS0.5Se0.5 thin films and mechanisms of combinational scattering of light from phonons were studied by X-ray diffraction and Raman spectroscopy methods. The results of X-ray diffraction show that the crystallite sizes found in the thin layers of the studied substances are in the order of nanometers and vary in the interval d~10.7 ÷ 30.8 nm. It was determined that the scattering bands of the PbSe0.5S0.5 sample with large nanoparticle sizes shift to the region of large wave numbers compared to the scattering bands observed in the region of low wave numbers.
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Research context

Nanomaterials

OpenAlex topics: Chalcogenide Semiconductor Thin Films · Quantum Dots Synthesis And Properties · Advanced Thermoelectric Materials and Devices

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