Study of the effect of CdCl2 introduction on the high temperature activation treatment of CdTe:As polycrystalline thin films
Source abstract
Abstract
V-doped CdTe polycrystalline films can achieve both doping activation and defect passivation by high-temperature CdCl2 heat treatment, but this requires simultaneous modulation of the amount of CdCl2 introduced to obtain high-quality films. It is found that increasing the CdCl2 introduction does not change the physical phase structure and lattice constant of CdTe:As thin films, but promotes grain recrystallisation, and can promote the formation of A-center, and inhibit the formation of Cd vacancy (VCd) defects, as well as the formation of deep energy level defects. The results provide guidance for the improvement of high-temperature CdCl2 heat treatment of V-doped CdTe polycrystalline thin films.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Chalcogenide Semiconductor Thin Films · Advanced Semiconductor Detectors and Materials · Quantum Dots Synthesis And Properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (37)
Show source-provided references
1. [1] S. Grover, X. Li, D. Lu, R. Mallick, G. Xiong, M. Gloeckler, 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)2019, pp. 0019-0020.10.1109/PVSC40753.2019.8980934 ↗
2. [2] E. Colegrove, J.H. Yang, S.P. Harvey, M.R. Young, J.M. Burst, J.N. Duenow, D.S. Albin, S.H. Wei, W.K. Metzger, J. Phys. D: Appl. Phys., 51 (2018) 075102; https://doi.org/10.1088/1361- 6463/aaa67e10.1088/1361-6463/aaa67e ↗
3. [3] B.E. McCandless, W.A. Buchanan, C.P. Thompson, G. Sriramagiri, R.J. Lovelett, J. Duenow, D. Albin, S. Jensen, E. Colegrove, J. Moseley, H. Moutinho, S. Harvey, M. Al-Jassim, W.K. Metzger, Sci. Rep., 8 (2018) 14519; https://doi.org/10.1038/s41598-018-32746-y10.1038/s41598-018-32746-y ↗
4. [4] A. Kanevce, M.O. Reese, T.M. Barnes, S.A. Jensen, W.K. Metzger, J. Appl. Phys., 121 (2017) 214506; https://doi.org/10.1063/1.498432010.1063/1.4984320 ↗
5. [5] W.K. Metzger, D.W. Miller, R. Mallick, X. Li, W. Zhang, I. Wang, A. Polizzotti, T. Ablekim, D.H. Cao, D.C. Hamilton, J. Bailey, C. Lee, S. Grover, D. Lu, G. Xiong, IEEE J. Photovoltaics, 12 (2022) 1435-1438; https://doi.org/10.1109/JPHOTOV.2022.320147910.1109/JPHOTOV.2022.3201479 ↗
6. [6] D. Krasikov, I. Sankin, Phys. Rev. Mater., 2 (2018) 103803; https://doi.org/10.1103/PhysRevMaterials.2.10380310.1103/PhysRevMaterials.2.103803 ↗
7. [7] S.-H. Wei, S.B. Zhang, Physical Review B, 66 (2002) 155211; https://doi.org/10.1103/PhysRevB.66.08540110.1103/PhysRevB.66.085401 ↗
8. [8] T. Ablekim, S.K. Swain, W.-J. Yin, K. Zaunbrecher, J. Burst, T.M. Barnes, D. Kuciauskas, S.- H. Wei, K.G. Lynn, Sci. Rep., 7 (2017) 4563; https://doi.org/10.1038/s41598-017-04719-010.1038/s41598-017-04719-0 ↗
9. [9] J.-H. Yang, W.-J. Yin, J.-S. Park, J. Burst, W.K. Metzger, T. Gessert, T. Barnes, S.-H. Wei, J. Appl. Phys., 118 (2015); https://doi.org/10.1063/1.492674810.1063/1.4926748 ↗
10. [10] B. McCandless, W. Buchanan, G. Sriramagiri, C. Thompson, J. Duenow, D. Albin, S.A. Jensen, J. Moseley, M. Al-Jassim, W.K. Metzger, IEEE J. Photovoltaics, 9 (2019) 912-917; https://doi.org/10.1109/JPHOTOV.2019.290235610.1109/JPHOTOV.2019.2902356 ↗
11. [11] W.K. Metzger, S. Grover, D. Lu, E. Colegrove, J. Moseley, C.L. Perkins, X. Li, R. Mallick, W. Zhang, R. Malik, J. Kephart, C.S. Jiang, D. Kuciauskas, D.S. Albin, M.M. Al-Jassim, G. Xiong, M. Gloeckler, Nature Energy, 4 (2019) 837-845; https://doi.org/10.1038/s41560-019- 0446-710.1038/s41560-019-0446-7 ↗
12. [12] M. Amarasinghe, E. Colegrove, D. Albin, S. Swain, J. Duenow, X. Zheng, A. Ferguson, K. Lynn, W.K. Metzger, 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)2019, pp. 0025-0027.10.1109/PVSC40753.2019.8981177 ↗
13. [13] D.-B. Li, C. Yao, S.N. Vijayaraghavan, R.A. Awni, K.K. Subedi, R.J. Ellingson, L. Li, Y. Yan, F. Yan, Nature Energy, 6 (2021) 715-722; https://doi.org/10.1038/s41560-021-00848-z10.1038/s41560-021-00848-z ↗
14. [14] M.J. Watts, P. Hatton, R. Smith, T. Fiducia, A. Abbas, R. Greenhalgh, J.M. Walls, P. Goddard, Phys. Rev. Mater., 5 (2021) 035403; https://doi.org/10.1103/PhysRevMaterials.5.03540310.1103/PhysRevMaterials.5.035403 ↗
15. [15] C. Li, G. Chen, W. Wang, J. Zhang, L. Wu, X. Hao, L. Feng, J. Mater. Sci.: Mater. Electron., 29 (2018) 20718-20725; https://doi.org/10.1007/s10854-018-0212-910.1007/s10854-018-0212-9 ↗
16. [16] J. Moseley, W.K. Metzger, H.R. Moutinho, N. Paudel, H.L. Guthrey, Y. Yan, R.K. Ahrenkiel, M.M. Al-Jassim, J. Appl. Phys., 118 (2015) 025702; https://doi.org/10.1063/1.492672610.1063/1.4926726 ↗
17. [17] I. Dharmadasa, Coatings, 4 (2014) 282-307; https://doi.org/10.3390/coatings402028210.3390/coatings4020282 ↗
18. [18] T. Bidaud, J. Moseley, M. Amarasinghe, M. Al-Jassim, W.K. Metzger, S. Collin, Phys. Rev. Mater., 5 (2021) 064601; https://doi.org/10.1103/PhysRevMaterials.5.06460110.1103/PhysRevMaterials.5.064601 ↗
19. [19] M. Amarasinghe, E. Colegrove, J. Moseley, H. Moutinho, D. Albin, J. Duenow, S. Jensen, J. Kephart, W. Sampath, S. Sivananthan, M. Al-Jassim, W.K. Metzger, Adv. Energy Mater., 8 (2018) 1702666; https://doi.org/10.1002/aenm.20170266610.1002/aenm.201702666 ↗
20. [20] C.A. Hsu, V. Palekis, I. Khan, S. Collins, D. Morel, C. Ferekides, 2017 IEEE 44th 808 Photovoltaic Specialist Conference (PVSC)2017, pp. 3413-3416.10.1109/PVSC.2017.8366767 ↗
21. [21] S. Paul, S. Sohal, C. Swartz, D.-B. Li, S.S. Bista, C.R. Grice, Y. Yan, M. Holtz, J.V. Li, Solar Energy, 211 (2020) 938-948; https://doi.org/10.1016/j.solener.2020.10.01510.1016/j.solener.2020.10.015 ↗
22. [22] W. Orellana, E. Menéndez-Proupin, M.A. Flores, Sci. Rep., 9 (2019) 9194; https://doi.org/10.1038/s41598-019-45625-x10.1038/s41598-019-45625-x ↗
23. [23] J. Guo, F.G. Sen, A. Mannodi-Kannakithodi, E.S. Barnard, W. Sampath, A. Munshi, M. Kim, M.K.Y. Chan, R.F. Klie, 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)2019, pp. 0783-0785.10.1109/PVSC40753.2019.8980721 ↗
24. [24] C. Doroody, K.S. Rahman, S.F. Abdullah, M.N. Harif, H.N. Rosly, S.K. Tiong, N. Amin, Results Phys., 18 (2020) 103213; https://doi.org/10.1016/j.rinp.2020.10321310.1016/j.rinp.2020.103213 ↗
25. [25] N. Shrestha, C.R. Grice, E. Bastola, G.K. Liyanage, A.B. Phillips, M.J. Heben, Y. Yan, R.J. Ellingson, MRS Advances, 3 (2018) 3293-3299; https://doi.org/10.1557/adv.2018.51610.1557/adv.2018.516 ↗
26. [26] M. Tuteja, P. Koirala, J. Soares, R. Collins, A. Rockett, J. Mater. Res., 31 (2016) 186-194; https://doi.org/10.1557/jmr.2015.39910.1557/jmr.2015.399 ↗
27. [27] N.C. Gilestaylor, R.N. Bicknell, D.K. Blanks, T.H. Myers, J.F. Schetzina, Journal of Vacuum Science & Technology A-Vacuum Surfaces and Films, 3 (1985) 76-82; https://doi.org/10.1116/1.57325010.1116/1.573250 ↗
28. [28] S. Vatavu, H. Zhao, V. Padma, R. Rudaraju, D.L. Morel, P. Gaşin, I. Caraman, C.S. Ferekides, Thin Solid Films, 515 (2007) 6107-6111; https://doi.org/10.1016/j.tsf.2006.12.10810.1016/j.tsf.2006.12.108 ↗
29. [29] D.P. Halliday, M.D.G. Potter, J.T. Mullins, A.W. Brinkman, J. Cryst. Growth, 220 (2000) 30- 38; https://doi.org/10.1016/S0022-0248(00)00755-710.1016/S0022-0248(00)00755-7 ↗
30. [30] D. Kuciauskas, P. Dippo, Z. Zhao, L. Cheng, A. Kanevce, W.K. Metzger, M. Gloeckler, IEEE J. Photovoltaics, 6 (2016) 313-318; https://doi.org/10.1109/JPHOTOV.2015.248336610.1109/JPHOTOV.2015.2483366 ↗
31. [31] X.H. Zhao, M.J. DiNezza, S. Liu, P.A.R.D. Jayathilaka, O.C. Noriega, T.H. Myers, Y.H. Zhang, 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)2014, pp. 3272-3275; https://doi.org/10.1109/PVSC.2014.692563410.1109/PVSC.2014.6925634 ↗
32. [32] J.M. Kephart, A. Kindvall, D. Williams, D. Kuciauskas, P. Dippo, A. Munshi, W.S. Sampath, IEEE J. Photovoltaics, 8 (2018) 587-593; https://doi.org/10.1109/JPHOTOV.2017.278702110.1109/JPHOTOV.2017.2787021 ↗
33. [33] D.M. Hofmann, P. Omling, H.G. Grimmeiss, B.K. Meyer, K.W. Benz, D. Sinerius, Physical Review B, 45 (1992) 6247-6250; https://doi.org/10.1103/PhysRevB.45.624710.1103/PhysRevB.45.6247 ↗
34. [34] H.Y. Shin, C.Y. Sun, Materials Science and Engineering B-solid State Materials for Advanced Technology, 52 (1998) 78-83; https://doi.org/10.1016/S0921-5107(97)00145-110.1016/S0921-5107(97)00145-1 ↗
35. [35] C. Kraft, H. Metzner, M. Hädrich, U. Reislöhner, P. Schley, G. Gobsch, R. Goldhahn, J. Appl. Phys., 108 (2010); https://doi.org/10.1063/1.351743610.1063/1.3517436 ↗
36. [36] S. Vatavu, H. Zhao, I. Caraman, P. Gaşin, C. Ferekides, Thin Solid Films, 517 (2009) 2195- 2201; https://doi.org/10.1016/j.tsf.2008.10.08710.1016/j.tsf.2008.10.087 ↗
37. [37] S. Vatavu, H. Zhao, I. Caraman, P. Gasin, C. Ferekides, Thin Solid Films, 519 (2011) 7176- 7179; https://doi.org/10.1016/j.tsf.2011.01.37210.1016/j.tsf.2011.01.372 ↗