journal article·2018-09-25

Probing the Internal Atomic Charge Density Distributions in Real Space

Gabriel Sánchez-Santolino, Nathan R. Lugg, Takehito Seki, Ryo Ishikawa, Scott D. Findlay, Yuji Kohno, Yuya Kanitani, Shinji Tanaka, Shigetaka Tomiya, Yuichi Ikuhara, Naoya Shibata

ACS Nano· Volume 12· Issue 9
Publisher page

Abstract

Probing the charge density distributions in materials at atomic scale remains an extremely demanding task, particularly in real space. However, recent advances in differential phase contrast-scanning transmission electron microscopy (DPC-STEM) bring this possibility closer by directly visualizing the atomic electric field. DPC-STEM at atomic resolutions measures how a sub-angstrom electron probe passing through a material is affected by the atomic electric field, the field between the nucleus and the surrounding electrons. Here, we perform a fully quantitative analysis which allows us to probe the charge density distributions inside atoms, including both the positive nuclear and the screening electronic charges, with subatomic resolution and in real space. By combining state-of-the-art DPC-STEM experiments with advanced electron scattering simulations we are able to map the spatial distribution of the electron cloud within individual atomic columns. This work constitutes a crucial step toward the direct atomic scale determination of the local charge redistributions and modulations taking place in materials systems.
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Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Institute of Engineering Innovation, School of Engineering, The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo 113-8656, Japan

School of Physics and Astronomy, Monash University, Clayton, Victoria 3800, Australia

Electron Optics Division JEOL Limited, Tokyo 196-8558, Japan

Advanced Technology Research Division, SONY Corporation, 4-14-1, Asahi, Atsugi-shi, Kanagawa 243-0014, Japan

Nanostructures Research Laboratory, Japan Fine Ceramic Center, 2-4-1 Mutsuno, Atsuta-ku, Nagoya 456-8587, Japan

Funding

New Energy and Industrial Technology Development Organization · Ministry of Education, Culture, Sports, Science and Technology · Australian Research Council · Development of Advanced Measurement and Analysis Systems

References (40)

Show source-provided references
1. 10.1038/3382310.1038/33823 ↗
2. 10.1016/S0304-3991(99)00013-310.1016/S0304-3991(99)00013-3 ↗
3. 10.1126/science.110096510.1126/science.1100965 ↗
4. 10.1103/PhysRevLett.102.09610110.1103/PhysRevLett.102.096101 ↗
5. 10.1093/jmicro/dfv01410.1093/jmicro/dfv014 ↗
6. 10.1126/science.168.3937.133810.1126/science.168.3937.1338 ↗
7. 10.1038/nature0097210.1038/nature00972 ↗
8. 10.1103/PhysRevLett.92.09550210.1103/PhysRevLett.92.095502 ↗
9. 10.1038/nmat248610.1038/nmat2486 ↗
10. 10.1038/nature0887910.1038/nature08879 ↗
11. 10.1038/4340310.1038/43403 ↗
12. 10.1038/nmat294110.1038/nmat2941 ↗
13. 10.1103/PhysRevLett.109.20680310.1103/PhysRevLett.109.206803 ↗
14. 10.1103/PhysRevLett.118.08610110.1103/PhysRevLett.118.086101 ↗
15. 10.1021/acs.accounts.7b0012310.1021/acs.accounts.7b00123 ↗
16. 10.1038/nphys233710.1038/nphys2337 ↗
17. 10.1038/ncomms665310.1038/ncomms6653 ↗
18. 10.1038/ncomms1563110.1038/ncomms15631 ↗
19. Waddell E. · Optik · 1979 · 54 · 83
20. Rose H. · Optik · 1974 · 416
21. Dekkers N. H. · Optik · 1974 · 41 · 452
22. 10.1016/j.ultramic.2015.09.00210.1016/j.ultramic.2015.09.002 ↗
23. 10.1063/1.11183210.1063/1.111832 ↗
24. 10.1016/j.ultramic.2012.03.02010.1016/j.ultramic.2012.03.020 ↗
25. 10.1002/admi.20140028110.1002/admi.201400281 ↗
26. 10.1038/srep2845910.1038/srep28459 ↗
27. 10.1016/j.ultramic.2017.07.00210.1016/j.ultramic.2017.07.002 ↗
28. 10.1103/PhysRevA.91.02380510.1103/PhysRevA.91.023805 ↗
29. 10.1016/j.ultramic.2016.05.00410.1016/j.ultramic.2016.05.004 ↗
30. 10.1093/jmicro/dfq01410.1093/jmicro/dfq014 ↗
31. 10.1103/PhysRevLett.110.06550410.1103/PhysRevLett.110.065504 ↗
32. 10.1016/j.ultramic.2017.07.01310.1016/j.ultramic.2017.07.013 ↗
33. 10.1016/0304-3991(93)90043-W10.1016/0304-3991(93)90043-W ↗
34. 10.1046/j.1365-2818.1998.3260881.x10.1046/j.1365-2818.1998.3260881.x ↗
35. 10.1016/j.ultramic.2015.10.01110.1016/j.ultramic.2015.10.011 ↗
36. 10.1103/PhysRevLett.64.93810.1103/PhysRevLett.64.938 ↗
37. Williams D. B. · 200910.1007/978-0-387-76501-3 ↗
38. 10.1016/j.ultramic.2010.04.00410.1016/j.ultramic.2010.04.004 ↗
39. 10.1017/S143192761301366410.1017/S1431927613013664 ↗
40. 10.1103/PhysRevB.82.10410310.1103/PhysRevB.82.104103 ↗