journal article·2024-02-01Open access

Optical and electrical properties of Ni+2 doped nanocrystalline Bi2S3 thin films prepared by chemical bath deposition method

Department of Physics, Presidency College, Motbung-795107, Manipur, India, M. A. Hussain, P. J. Saikia, Department of Electronics, Jagannath Barooah College (Autonomous), Jorhat785001, Assam, India, S. R. Devi, Department of Physics, Presidency College, Motbung-795107, Manipur, India, L. R. Singh, Department of Physics, D.M. College of Science, Imphal-795001, Manipur, India

Chalcogenide Letters· Volume 21· Issue 2

Abstract

Nickel (Ni+2) doped nanocrystalline Bi2S3 thin films are deposited on the glass substrate from the solutions containing Bismuth Nitrate, Ethylenediamine Tetraacetic acid (EDTA) and Thioacetamide at a bath deposition temperature of 318K. The optical, surface morphological and electrical properties of Ni-doped Bi2S3 thin films prepared at three different doping concentration are investigate by using ultraviolet–visible transmission spectra (UV–Vis), Scanning electron microscopy (SEM), Energy Dispersive X-ray (EDAX) and thermo-e.m.f. techniques. The optical band gap energies are found in between 2.32-2.43 eV. The SEM images show that the prepared films are continuous, dense and distributed over the entire area with good uniformity. The electrical conductivity of the films are in the order of 10-2 Ω-1 m-1 . The films are n-type as determined from the Hot Probe method. Photoconductivity studies reveal that photocurrent increases with the increase in Ni doping concentrations. Due to the absorption of photons, free electron-hole pairs (EHP) are produce.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Chalcogenide Semiconductor Thin Films · Quantum Dots Synthesis And Properties · Advanced Thermoelectric Materials and Devices

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (42)

Show source-provided references
1. [1] C. Ghosh, B.P. Varma, Solid State Communications 31(9), (1979), 683-686; https://doi.org/10.1016/0038-1098(79)90323-510.1016/0038-1098(79)90323-5 ↗
2. [2] F. Ding, Q.Wang, S. Zhou, G. Zhao, Y. Ye, R. Ghomashchi, R. Soc. Open Sci. 7 (2020) 200479; https://doi.org/10.1098/rsos.20047910.1098/rsos.200479 ↗
3. [3] J.S. Curran, R. Phillippe, Proceedings of the 14th International Conference on ECVP Solar Energy, Stresa, 10-14 May (1982).
4. [4] J. Stuke, Journal of Non-Crystalline Solids 4 (1970) 1-26; https://doi.org/10.1016/0022-3093(70)90015-310.1016/0022-3093(70)90015-3 ↗
5. [5] A. Jana, C. Bhattacharya, S. Sinha, J. Datta, J. Solid State Electrochem. 13 (2008), 1339-1350; https://doi.org/10.1007/s10008-008-0679-z10.1007/s10008-008-0679-z ↗
6. [6] C.D. Lokhande, Materials Chemistry and Physics27(1) (1991) 1-43; https://doi.org/10.1016/0254-0584(91)90158-Q10.1016/0254-0584(91)90158-Q ↗
7. [7] L.M. Peter, J. Electroanal. Chem., 98 (1979) 49; https://doi.org/10.1016/S0022- 0728(79)80283-1
8. [8] J. Lukose and B. Pradeep, Solid State Commun., 78 (1991) 535-538; https://doi.org/10.1016/0038-1098(91)90371-210.1016/0038-1098(91)90371-2 ↗
9. [9] S. Mahmoud and F. Sharaf, FizikaA5 (1996) 205-213; https://doi.org/10.1002/(SICI)1097-0177(199603)205:33.0.CO;2-L10.1002/(SICI)1097-0177(199603)205:3<213::AID-AJA1>3.3.CO;2-N ↗
10. [10] K. Mageshwari, R. Sathyamoorthy, P. Sudhagar and Y.S. Kang,Appl. Surf. Sci., 257 (2011) 7245-7253; https://doi.org/10.1016/j.apsusc.2011.03.10010.1016/j.apsusc.2011.03.100 ↗
11. [11] K. Mageshwari and R. Sathyamoorthy, Vacuum, 86(2012) 2029-2034; https://doi.org/10.1016/j.vacuum.2012.04.00610.1016/j.vacuum.2012.04.006 ↗
12. [12] C. D. Lokhande and C.H. Bhosale, Bull. Electrochem., 6 (1990) 622.
13. [13] B. Miller, S. Menzes and A. Heller, J. Electroanal. Chem., 94 (1978) 85-89; https://doi.org/10.1016/S0022-0728(78)80326-X10.1016/S0022-0728(78)80326-X ↗
14. [14] P. A. Krishnamoorthy and G. K. Shivkumar, Thin Solid Films, 121 (1984) 151; https://doi.org/10.1016/0040-6090(84)90237-210.1016/0040-6090(84)90237-2 ↗
15. [15] S. H. Pawar, P. N. Bhosale, M. D. Uplane and S. P. Tamhankar, Thin solid Films, 110 (1983) 165-170; https://doi.org/10.1016/0040-6090(83)90220-110.1016/0040-6090(83)90220-1 ↗
16. [16] S. H. Pawar, S. P. Tamhankar and C. D. Lokhande, Mater. Chem. Phys., 11 (1984) 401-412; https://doi.org/10.1016/0254-0584(84)90064-610.1016/0254-0584(84)90064-6 ↗
17. [17] S.A. Mahmoud, PhysicaB,301 (2001) 310-317; https://doi.org/10.1016/S0921- 4526(01)00272-110.1016/S0921-4526(01)00272-1 ↗
18. [18] A. U. Ubale, Mater. Chem. Phys., 121 (2010) 555-560; https://doi.org/10.1016/j.matchemphys.2010.02.02110.1016/j.matchemphys.2010.02.021 ↗
19. [19] A. Jana, C. Bhattacharya, S. Sinha and J. Datta, J. Solid State Electrochem.,13 (2009) 1339- 1350; https://doi.org/10.1007/s10008-008-0679-z10.1007/s10008-008-0679-z ↗
20. [20] R.R. Ahire and R. P. Sharma, Indian J. Eng. Mater. Sci., 13 (2006) 140-144.
21. [21] R.S. Mane, B. R. Shankapal and C. D. Lokhande, Mater. Res. Bull., 35 (2000) 587-601; https://doi.org/10.1016/S0025-5408(00)00244-010.1016/S0025-5408(00)00244-0 ↗
22. [22] C.D. Lokhande, A. U. Ubale and P. S Patil, Thin Solid Films, 302 (1997) 1-4; https://doi.org/10.1016/S0040-6090(96)09540-510.1016/S0040-6090(96)09540-5 ↗
23. [23] J.D. Desai and C. D. Lokhande, Mater. Chem. Phys., 41 (1995) 98-103; https://doi.org/10.1016/0254-0584(95)01538-810.1016/0254-0584(95)01538-8 ↗
24. [24] A. Hussain, A. Begum and A. Rahman, Materials Science in Semiconductor Processing 21 (2014) 74-81; https://doi.org/10.1016/j.mssp.2014.01.02910.1016/j.mssp.2014.01.029 ↗
25. [25] R. Sakthivel, S. Kubendhiran, S.-M. Chen, Ultrasonic Sonochemical 54, (2019)68-78; https://doi.org/10.1016/j.ultsonch.2019.02.01310.1016/j.ultsonch.2019.02.013 ↗
26. [26] N. Anasane, R. Ameta, Material Science 35, (2017)1; https://doi.org/10.1515/msp-2017-0032[27] P. UshaRajalakshmi, Rachel Oommen, C. Sanjeeviraja, V. Ganesan, Superlattice Microstructure. 57, (2013) 158-165; https://doi.org/10.1016/j.spmi.2013.01.00310.1016/j.spmi.2013.01.003 ↗
27. [28] S. Subramanian, Journal of Non-Crystalline Solids 356(23), (2010)1173-1179; https://doi.org/10.1016/j.jnoncrysol.2010.03.01210.1016/j.jnoncrysol.2010.03.012 ↗
28. [29] P. Usha Rajalakshmi, R. Oommen, C. Sanjeeviraja, Thin Solid Films 531, (2013)76-80; https://doi.org/10.1016/j.tsf.2012.12.04510.1016/j.tsf.2012.12.045 ↗
29. [30] V. Balasubramanian, N. Suriyanarayanan, Mater. Lett. 91, (2013)362-364; https://doi.org/10.1016/j.matlet.2012.09.09910.1016/j.matlet.2012.09.099 ↗
30. [31] Arshad Hussain, R. Ahmed, Nisar Ali, Naser M AbdEl-Salam, Karim bin Deraman, Yong Qing Fu, Surf. Coat. Technol. 320, (2017)404-408; https://doi.org/10.1016/j.surfcoat.2016.12.01210.1016/j.surfcoat.2016.12.012 ↗
31. [32]M.V. Yakushev, P. Maiello, T. Raadik, M.J. Shaw, P.R. Edwards, J. Krustok, A.V. Mudryi, I. Forbes, R.W. Martin, Thin Solid Films 562, (2014)195-199; https://doi.org/10.1016/j.tsf.2014.04.05710.1016/j.tsf.2014.04.057 ↗
32. [33] R.S. Silva, H.D. Mikhail, E.V.Guimarães, E.R.Gonçalves, N.F. Cano, N.O.Dantas, Molecules 22(7), 2017)1142; https://doi.org/10.3390/molecules2207114210.3390/molecules22071142 ↗
33. [34] Priyanka R. Jagadish, Mohammad Khalid, Lau Phei Li, Nowshad Amin, RashmiWalvekar, and Andy Chan., AIP Conf. Proc. 2137(1), 020004 (2019)10.1063/1.5120980 ↗
34. [35] O.K. Okoth, K Yan, Y Liu, J Zhang, Biosens. Bioelectron. 86, (2016)636-642; https://doi.org/10.1016/j.bios.2016.07.03710.1016/j.bios.2016.07.037 ↗
35. [36] A Hussain, A Begum and A Rahman, Indian J. Phys (August 2012) 86(8):697-701; https://doi.org/10.1007/s12648-012-0130-210.1007/s12648-012-0130-2 ↗
36. [37] N. F. Mott, and E. A. Davis, Electronics Processes in Non-Crystalline Materials, Clarendon, Oxford, 1979, p 428.
37. [38] Juan Chu, ZhengguoJin, Shu Cai, Jingxia Yang and Zhanglian Hong, Thin Solid Films, 520 (2012) 182-1831.10.1016/j.tsf.2011.08.101 ↗
38. [39] R. Sahraei, S. Shahriyar, M. H. MajlesAra, A. Daneshfar and N. Shokri, Prog. Color Colorants Coat, 3 (2010) 82-90.
39. [40] S. Prabahar, and M. Dhanam, Journal Crystal Growth, 285 (2005) 41-48; https://doi.org/10.1016/j.jcrysgro.2005.08.00810.1016/j.jcrysgro.2005.08.008 ↗
40. [41] S. Mageswari, L. Dhivya, B. Palanivel and R. Murugan, Journal of Alloys and Compounds, 545 (2012) 41-45; https://doi.org/10.1016/j.jallcom.2012.08.01010.1016/j.jallcom.2012.08.010 ↗
41. [42] Sanjoy Paul, Istvan Gulyas, Ingrid L. Repins, Shin Mou, Jian V. Li,
42. [43] J. Lukose and B. Pradeep, Solid State Commun., 78 (1991) 535-538; https://doi.org/10.1016/0038-1098(91)90371-210.1016/0038-1098(91)90371-2 ↗