journal article·2010-08-24

High-Resolution Functional Epoxysilsesquioxane-Based Patterning Layers for Large-Area Nanoimprinting

Carlos Pina-Hernandez, L. Jay Guo, Peng-Fei Fu

ACS Nano· Volume 4· Issue 8
Publisher page

Abstract

Epoxysilsesquioxane (SSQ)-based materials have been developed as patterning layers for large-area and high-resolution nanoimprinting. The SSQ polymers, poly(methyl-co-3-glycidoxypropyl) silsesquioxanes (T(Me)T(Ep)), poly(phenyl-co-3-glycidoxypropyl) silsesquioxanes (T(Ph)T(Ep)), and poly(phenyl-co-3-glycidoxypropyl-co-perfluorooctyl) silsesquioxanes (T(Ph)T(Ep)T(Fluo)), were precisely designed and synthesized by incorporating the necessary functional groups onto the SSQ backbone. The materials possess a variety of characteristics desirable for NIL, such as great coatability, high modulus, good mold release, and excellent dry etch resistance. In particular, the presence of epoxy functional groups allows the resists to be solidified within seconds under UV exposure at room temperature, and the presence of the fluoroalkyl groups in the SSQ resins greatly facilitate mold release after the imprint process. In addition, the absence of metal in the resins makes the materials highly compatible with applications involving Si CMOS integrated circuits fabrication.
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Research context

OpenAlex topics: Nanofabrication and Lithography Techniques · Metal and Thin Film Mechanics · Advanced Surface Polishing Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Macromolecular Science and Engineering

and Department of Electrical Engineering and Computer Science, The University of Michigan, 1301 Beal Avenue, Ann Arbor, Michigan 48109

Dow Corning Corporation, Midland, Michigan 48686

References (50)

Show source-provided references
1. Roger J. A. · 200810.1002/9780470405789 ↗
2. Chou S. Y. · Science · 1996 · 272 · 8510.1126/science.272.5258.85 ↗
3. Chou S. Y. · Appl. Phys. Lett. · 1995 · 67 · 311410.1063/1.114851 ↗
4. Guo L. J. · Adv. Mater. · 2007 · 19 · 49510.1002/adma.200600882 ↗
5. Ahn S. W. · Nanotechnology · 2005 · 16 · 187410.1088/0957-4484/16/9/076 ↗
6. Ekinci Y. · Opt. Express · 2006 · 14 · 232310.1364/OE.14.002323 ↗
7. Cheng X. · J. Vac. Sci. Technol., B · 2002 · 20 · 287710.1116/1.1515307 ↗
8. Kao P. C. · IEEE Trans. Electron Devices · 2005 · 52 · 172210.1109/TED.2005.851811 ↗
9. Wang J. · Laser Focus World · 2005 · 41 · 76
10. McClelland G. M. · Appl. Phys. Lett. · 2002 · 81 · 148310.1063/1.1501763 ↗
11. Moritz J. · Appl. Phys. Lett. · 2004 · 84 · 151910.1063/1.1644341 ↗
12. Martensson T. · Nano Lett. · 2004 · 4 · 69910.1021/nl035100s ↗
13. Guo L. J. · Nano Lett. · 2004 · 4 · 6910.1021/nl034877i ↗
14. Falconnet D. · Nano Lett. · 2004 · 4 · 190910.1021/nl0489438 ↗
15. Hoff J. D. · Nano Lett. · 2004 · 4 · 85310.1021/nl049758x ↗
16. http://www.itrs.net/reports.html.
17. Colburn, M. E.Ph.D. Dissertation, University of Texas at Austin, 2001.
18. Kim E. K. · J. Vac. Sci. Technol., B · 2004 · 22 · 13110.1116/1.1635849 ↗
19. Hagberg E. C. · Nano Lett. · 2007 · 7 · 23310.1021/nl061217f ↗
20. Cheng X. · Adv. Mater. · 2005 · 17 · 141910.1002/adma.200401192 ↗
21. Baney R. H. · Chem. Rev. · 1995 · 95 · 140910.1021/cr00037a012 ↗
22. Crivello J. V. · 2007 · 964 · 2710.1021/bk-2007-0964.ch003 ↗
23. Song K. Y. · Chem. Mater. · 2001 · 13 · 193210.1021/cm0100671 ↗
24. Crivello J. V. · Abstracts of Papers · 1989 · 60 · 197
25. Stewart M. D. · Proc. SPIE · 2005 · 5751 · 21010.1117/12.599977 ↗
26. Seung J. C. · Macromolecules · 2004 · 37 · 9910.1021/ma030309d ↗
27. Crivello J. V. · Polym. Sci., Polym. Chem. Ed. · 1997 · 35 · 40710.1002/(SICI)1099-0518(199702)35:3<407::AID-POLA3>3.0.CO;2-P ↗
28. Crivello J. V. · Chem. Mater. · 1997 · 9 · 156210.1021/cm960595q ↗
29. Ro H. W. · Adv. Mater. · 2007 · 19 · 291910.1002/adma.200602872 ↗
30. Palmieri F. · Proc. SPIE · 2006 · 6151 · 61510J10.1117/12.655604 ↗
31. De Girolamo J. · J. Vac. Sci. Technol., B · 2008 · 26 · 227110.1116/1.2998709 ↗
32. Acikgoz C. · J. Appl. Mater. Interfaces · 2009 · 1 · 264510.1021/am9005379 ↗
33. Vogler M. · Proc. SPIE · 2007 · 6517 · 651727-1
34. Ji R. · Microelectron. Eng. · 2010 · 87 · 96310.1016/j.mee.2009.11.134 ↗
35. Houle F. A. · J. Photopolym. Sci. Technol. · 2008 · 21 · 56310.2494/photopolymer.21.563 ↗
36. Houle F. A. · Proc. SPIE · 2008 · 6921 · 69210B-1
37. Schmid G. M. · J. Vac. Sci. Technol., B · 2009 · 27 · 57310.1116/1.3081981 ↗
38. McMackin I. · J. Vac. Sci. Technol., B · 2008 · 26 · 15110.1116/1.2825164 ↗
39. Schmidt, H.; Rinn, G.; Nass, R.; Sporn, D.InBetter Ceramics through Chemistry;Brinker, C. J.; Clark, D. E.; Ulrich, D. R., Eds.Materials Research Society:Pittsburgh, PA, 1988; 743pp.
40. Noll W. · 1968
41. bBrook, M. A.Silicon in Organic, Organometallic, and Polymer Chemistry;Wiley:New York, 2000; pp9−12.
42. Taylor R. B. · 1991
43. Schmid H. · Macromolecules · 2000 · 33 · 304210.1021/ma982034l ↗
44. Pina-Hernandez C. · J. Vac. Sci. Technol., B · 2008 · 26 · 242610.1116/1.2987966 ↗
45. Park H. J. · ACS Nano · 2009 · 3 · 260110.1021/nn900701p ↗
46. Heath W. H. · Macromolecules · 2008 · 41 · 71910.1021/ma702291k ↗
47. Ahn S. H. · Adv. Mater. · 2008 · 20 · 204410.1002/adma.200702650 ↗
48. Kim E. K. · J. Vac. Sci. Technol., B · 2005 · 23 · 151510.1116/1.1990162 ↗
49. Long B. K. · J. Mater. Chem. · 2007 · 17 · 357510.1039/b705388f ↗
50. Costner E. A. · Annu. Rev. Mater. Res. · 2009 · 39 · 15510.1146/annurev-matsci-082908-145336 ↗