DataVXChalcogenide LettersPaper
journal article·2025-06-01Open access

Influence of Ag content on direct current conductivity of Agx(As2(Te0.5Se0.5)3)100-x system

University of Novi Sad, Faculty of Sciences, Department of Physics, Trg D. Obradovića 4, 21000 Novi Sad, Serbia, G. R. Štrbac, O. Bošák, Slovak University of Technology, Faculty of Materials Science and Technology, Bottova 25, 91724 Trnava, Slovakia, D. Štrbac, University of Novi Sad, Faculty of Technical Sciences, Trg D. Obradovića 6, 21000 Novi Sad, Serbia, R. Vigi, University of Novi Sad, Faculty of Sciences, Department of Physics, Trg D. Obradovića 4, 21000 Novi Sad, Serbia, M. Kubliha, Slovak University of Technology, Faculty of Materials Science and Technology, Bottova 25, 91724 Trnava, Slovakia, S. Minárik, Slovak University of Technology, Faculty of Materials Science and Technology, Bottova 25, 91724 Trnava, Slovakia

Chalcogenide Letters· Volume 22· Issue 5
Publisher pageOpen full text
Source abstract

Abstract

The temperature dependence of direct current (DC) conductivity, silver content, and the presence of crystalline phases in amorphous and annealed chalcogenides from the Agx(As2(Te0.5Se0.5)3)100-x system was investigated. Amorphous samples exhibited semiconducting behavior, with conductivity increase as the silver content raised. This increase was primarily attributed to electron transitions into delocalized states from states localized near the Fermi level. Percolation behavior in conductivity was observed in the samples containing 7 at.% or more silver. For annealed samples with silver content below 9 at.%, temperature-independent DC conductivity was identified, accompanied by a decrease in conductivity as the silver content increased.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Phase-change materials and chalcogenides · Chalcogenide Semiconductor Thin Films · Crystal Structures and Properties

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (32)

Show source-provided references
1. [1] Z.H. Khan, S.A. Khan, F.A. Agel, N. A. Salah, M. Husain, Advances in Nanomaterials, Springer, New Delhi, 135 (2016); https://doi.org/10.1007/978-81-322-2668-0_410.1007/978-81-322-2668-0_4 ↗
2. [2] J. Heo, W. J. Chung, (2014), Rare-earth-doped chalcogenide glass for lasers and amplifiers Chalcogenide Glasses, Woodhead Publishing, Sawston, 347 (2014) https://doi.org/10.1533/9780857093561.2.34710.1533/9780857093561.2.347 ↗
3. [3] J. Schubert, M.J. Schoning, Y.G. Mourzina, A.V. Legin, Y.G. Vlasov, W. Zander,H. Luth, Sensors and Actuators B: Chemical 76(1-3), 327 (2001); https://doi.org/10.1016/S0925- 4005(01)00616-510.1016/S0925-4005(01)00616-5 ↗
4. [4] B. Fan, B. Xue, Z. Luo, X.H. Zhang, H. Ma, L. Calvez, Journal of the American Ceramic Society 102(3), 1122 (2019); https://doi.org/10.1111/jace.1595410.1111/jace.15954 ↗
5. [5] R. Svoboda, D. Brandova, Journal of Alloys Compound 770, 564 (2019); https://doi.org/10.1016/j.jallcom.2018.08.15010.1016/j.jallcom.2018.08.150 ↗
6. [6] A. Zakery, S.R. Elliott, Journal of Non-Crystalline Solids 330(1-3), 1 (2003); https://doi.org/10.1016/j.jnoncrysol.2003.08.06410.1016/j.jnoncrysol.2003.08.064 ↗
7. [7] Y. Liu, R. Golovchak, W. Heffner, O. Shpotyuk, G. Chen, H. Jain, Journal of Materials Chemistry C1(40), 6677 (2013); https://doi.org/10.1039/c3tc30975d10.1039/c3tc30975d ↗
8. [8] Y. Wu, M. Meneghetti, J. Troles, J.L. Adam, Applied Sciences 8(9), 1637 (2018); https://doi.org/10.3390/app809163710.3390/app8091637 ↗
9. [9] N.A. Hegab, M. Fadel, I.S. Yahia, A. M. Salem, A.S. Farid, Journal of Electronic Materials 42(12), 3397 (2013); https://doi.org/10.1007/s11664-013-2756-z10.1007/s11664-013-2756-z ↗
10. [10] M.J. Schoning, J.P. Kloock, Electroanalysis 19(19-20), 2029 (2007); https://doi.org/10.1002/elan.20070395510.1002/elan.200703955 ↗
11. [11] B.J. Eggleton, B. Luther-Davies, K. Richardson, Nature photonics 5, 141 (2011); https://doi.org/10.1038/nphoton.2011.30910.1038/nphoton.2011.309 ↗
12. [12] V.S. Vassilev, S.V. Boycheva, Talanta 67(1),20 (2005); https://doi.org/10.1016/j.talanta.2005.02.02710.1016/j.talanta.2005.02.027 ↗
13. [13] M. Frumar, B. Frumarova, T. Wagner, Comprehensive Semiconductor Science and Technology, ed. by P. Bhattacharya, R. Fornari, H. Kamimura, Elsevier, Amsterdam, 206 (2011); https://doi.org/10.1016/B978-0-44-453153-7.00122-X10.1016/B978-0-44-453153-7.00122-X ↗
14. [14] Q. Yan, H. Jain, G. Yang, J. Ren, G. Chen, Journal of Applied Physics 112(5),053105 (2012); https://doi.org/10.1063/1.475202710.1063/1.4752027 ↗
15. [15] T. V. Moreno, L.C. Malacarne, M.L. Baesso, W. Qu, E. Dy, Z. Xie, J. Fahlman, J. Shen, N. G. C. Astrath, Journal of Non-Crystalline Solids 495, 8 (2018); https://doi.org/10.1016/j.jnoncrysol.2018.04.05710.1016/j.jnoncrysol.2018.04.057 ↗
16. [16] A.B. Seddon, Journal of Non-Crystalline Solids 184, 44 (1995); https://doi.org/10.1016/0022-3093(94)00686-510.1016/0022-3093(94)00686-5 ↗
17. [17] G. Yang, H. Jain, A. Ganjoo, D. Zhao, Y. Xu, H. Zeng, G. Chen, Optic Express 16(14), 10565 (2008); https://doi.org/10.1364/OE.16.01056510.1364/OE.16.010565 ↗
18. [18] B. Sujatha, N. Reddy, R. Chakradhar, Philosophical Magazine 20(19), 2635 (2010); https://doi.org/10.1080/1478643100366256410.1080/14786431003662564 ↗
19. [19] M. Jabeen, N. Ali , Z. Ali, H. Ali, A. A. A. Bahajjaj, B. Haq, S.H. Kim, Chalcogenide Letters 21(2), 125 (2024); https://doi.org/10.15251/CL.2024.212.12510.15251/CL.2024.212.125 ↗
20. [20] S. Cui, C. Boussard-Pledel1, L. Calvez, F. Rojas, K. Chen, H. Ning, M.J. Reece, T. Guizouarn, B. Bureau, Advances in Applied Ceramics:Structural, Functional and Bioceramics 114(1), 42 (2015); https://doi.org/10.1179/1743676115Y.000000005410.1179/1743676115Y.0000000054 ↗
21. [21] J. Zheng, L. Li, H. Yin, Y. Wang, J. Wei, H. Zeng, F. Xia, G. Chen, Ceramics International 46(14), 22826 (2020); https://doi.org/10.1016/j.ceramint.2020.06.05010.1016/j.ceramint.2020.06.050 ↗
22. [22] S. Stehlik, J. Kolar, M. Bartos, M. Vlcek, M. Frumar, V. Zima, T. Wagner, Solid State Ionics 181(37-38), 1625 (2010); https://doi.org/10.1016/j.ssi.2010.09.01610.1016/j.ssi.2010.09.016 ↗
23. [23] Yu G. Vlasov, E.A. Bychkov, B.L. Seleznev, Solid State Ionics 24(3), 179 (1987); https://doi.org/10.1016/0167-2738(87)90158-510.1016/0167-2738(87)90158-5 ↗
24. [24] Yu G. Vlasov, E.A. Bychkov, B.L. Seleznev, Solid State Ionics 18-19(1), 467 (1986); https://doi.org/10.1016/0167-2738(86)90161-X10.1016/0167-2738(86)90161-X ↗
25. [25] F. Kyriazis, A. Chrissanthopoulos, V. Dracopoulos, M. Krbal, T. Wagner, M. Frumar, S.N. Yannopoulos,Journal of Non-Crystalline Solids 355(37-42), 2010 (2009); https://doi.org/10.1016/j.jnoncrysol.2009.04.07010.1016/j.jnoncrysol.2009.04.070 ↗
26. [26] M. Krbal, T. Wagner, T. Srba, J. Schwarz, J. Orava, T. Kohoutek, V. Zima, L. Benes, S.O. Kasap, M. Frumar,Journal of Non-Crystalline Solids 353(13-15), 1232 (2007); https://doi.org/10.1016/j.jnoncrysol.2006.11.02410.1016/j.jnoncrysol.2006.11.024 ↗
27. [27] R. Vigi, O. Bošák, D. Štrbac, G. Štrbac, Journal of Thermal Analysis and Calorimetry, (2024); https://doi.org/10.1007/s10973-024-13253-x10.1007/s10973-024-13253-x ↗
28. [28] Z. Borisova, "Glassy Semiconductors", Springer Science+Business Media, New York, 393 (1981); https://doi.org/10.1007/978-1-4757-0851-610.1007/978-1-4757-0851-6 ↗
29. [29] S. Stehlik, P. Knotek, T. Wagner, V. Zima, M. Bartos, S.O. Kasap, M. Frumar, Journal of Non-Crystalline Solids. 355(37-42),2054 (2009); https://doi.org/10.1016/j.jnoncrysol.2009.04.06710.1016/j.jnoncrysol.2009.04.067 ↗
30. [30] K. O. Čajko, D. L. Sekulić, D. M. Petrović, V. Labaš, S. Minarik, S. J. Rakić, S. R. LukićPetrović,Journal of Non-Crystalline Solids 571,121056 (2021); https://doi.org/10.1016/j.jnoncrysol.2021.12105610.1016/j.jnoncrysol.2021.121056 ↗
31. [31] N. F. Mott, E. A. Davis, Electronic Processes in Non-Crystalline Materials Oxford University Press, New York 7 (1979)
32. [32] G. R. Štrbac, S. R. Lukić-Petrović, D. D. Štrbac, V. Benekou, A. Chrissanthopoulos, S. N. Yannopoulos, The Journal of Physical Chemistry B 124(14), 2950 (2020); https://doi.org/10.1021/acs.jpcb.0c0079910.1021/acs.jpcb.0c00799 ↗