2D Materials: Probing Effective Out‐of‐Plane Piezoelectricity in van der Waals Layered Materials Induced by Flexoelectricity (Small 46/2019)
Source abstract
Abstract
The piezoelectric property of van der Waals materials is difficult to be collected and quantified experimentally. In article number 1903106, Zhigao Hu and co-workers present an efficient scanning probe method to quantify the effective out-of-plane electromechanical coupling response on 2D layered materials including MoS2 and InSe by a free-standing designation.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Nonlocal and gradient elasticity in micro/nano structures
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Technical Center for Multifunctional Magneto‐Optical Spectroscopy (Shanghai) Department of Electronic Engineering East China Normal University Shanghai 200241 China
Collaborative Innovation Center of Extreme Optics Shanxi University Taiyuan 030006 Shanxi China
Shanghai Institute of Intelligent Electronics and Systems Fudan University Shanghai 200433 China
References
Reference metadata was not supplied for this record.