Physical Unclonable Function: Multilevel States of Nano‐Electromechanical Switch for a PUF‐Based Security Device (Small 3/2019)
Source abstract
Abstract
In article number 1803825, Yang-Kyu Choi and co-workers demonstrate a nano-electromechanical (NEM) switch by use of the physical unclonable function (PUF) for high security. This PUF is based on the inherent random stiction arising from microfabrication. To improve a security level, a single NEM switch has more than 4-states, which are distinguished by a magnitude and a direction of read current. This security key has high robustness against microwaves, radiation and thermal stress, and hence can provide a reliable authorized key for anti-hacking.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Physical Unclonable Functions (PUFs) and Hardware Security · Integrated Circuits and Semiconductor Failure Analysis
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Affiliations
School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro Daejeon 34141 Korea
Semiconductor R&D Center Samsung Electronics 1, Samsungjeonja‐ro Hwaseong 18448 Korea
System LSI Division Samsung Electronics 1, Samsung‐ro Yongin 17113 Korea
References
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