Corrigendum: Spray Deposition of Highly Transparent, Low‐Resistance Networks of Silver Nanowires over Large Areas
Source abstract
Abstract
The caption of Figure 2 and several references were incomplete when the article was published in Issue 18, Volume 7. The complete caption and citations appear below. Figure 2. A) Percolative figure of merit, Π, and B) percolative exponent, n, plotted as a function of back pressure. C) Product of Z0tminσOp calculated from Equation 3 using the data for Π and n reported above. In addition we take σDC/σOp = 415, consistent with previously published data. That this product is approximately constant implies that the variation in Π are due to the variation in n. The mean value of 0.18 is illustrated by the dashed line. D) The expected sheet resistance for films with T = 90% as a function of n, as calculated from Equation 4 using the mean value of 〈Z0tminσop〉 = 0.18 and σDC/σOp = 415.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Copper Interconnects and Reliability · Semiconductor materials and devices · Nanomaterials and Printing Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1063/1.346231710.1063/1.3462317 ↗
2. 10.1103/PhysRevLett.96.06660210.1103/PhysRevLett.96.066602 ↗
3. 10.1103/PhysRevB.77.17420410.1103/PhysRevB.77.174204 ↗
4. 10.1103/PhysRevB.74.03542610.1103/PhysRevB.74.035426 ↗