Integrated Tapping Mode Kelvin Probe Force Microscopy with Photoinduced Force Microscopy for Correlative Chemical and Surface Potential Mapping (Small 37/2021)
Source abstract
Abstract
Kelvin Probe Force Microscopy In article number 2102495, Xiaoji G. Xu and co-workers introduce a novel approach to surface potential imaging with tapping mode Kelvin probe force microscopy without the need for an external AC driving voltage – fully compatible with photoinduced force microscopy for multimodal nano-imaging.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Advanced Materials Characterization Techniques
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Affiliations
Department of Chemistry Lehigh University Bethlehem PA 18015 USA
Department of Materials Science and Engineering Peking University Beijing 100871 China
References
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