journal article·2020-03

Magnetic Force Microscopy: Comparison and Validation of Different Magnetic Force Microscopy Calibration Schemes (Small 11/2020)

Héctor Corte‐León, Volker Neu, Alessandra Manzin, Craig Barton, Yuanjun Tang, Manuela Gerken, Petr Klapetek, Hans Werner Schumacher, Olga Kazakova

Small· Volume 16· Issue 11
Publisher page

Abstract

Magnetic force microscopy (MFM), which allows mapping of the magnetic field distribution with nanoscale resolution, is a well-known tool. However, for the last two decades, calibration was available only to a few labs. Now, after a few years of active research, the calibration protocols have been reviewed and improved, making it available to every laboratory. In article number 1906144, Héctor Corte-León and co-workers show the progress done toward making quantitative MFM a common tool in nanocharacterization laboratories.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Force Microscopy Techniques and Applications

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Affiliations

National Physical Laboratory Hampton Road Teddington TW11 0LW UK

Leibniz IFW Dresden Helmholtzstr. 20 Dresden 01069 Germany

Istituto Nazionale di Ricerca Metrologica Torino I‐10135 Italy

Physikalisch‐Technische Bundesanstalt Braunschweig D‐38116 Germany

Department of Nanometrology Czech Metrology Institute Okružní 31 Brno 638 00 Czech Republic

References

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