4D‐STEM: Interferometric 4D‐STEM for Lattice Distortion and Interlayer Spacing Measurements of Bilayer and Trilayer 2D Materials (Small 28/2021)
Source abstract
Abstract
The electronic properties of stacked few-layer 2D materials are highly dependent on their precise structural arrangement. In article number 2100388, featured on the front cover, Michael J. Zachman, Miaofang Chi, and co-workers describe a four-dimensional scanning transmission electron microscopy technique that utilizes interference between Bragg discs to enable high-resolution mapping of picometer-scale structural reconstructions and measurement of average interlayer spacings in these materials.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Ga2O3 and related materials · 2D Materials and Applications
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Affiliations
Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN 37831 USA
Faculty of Physics University of Vienna Boltzmanngasse 5 Vienna 1090 Austria
Department of Materials Science and NanoEngineering Rice University Houston TX 77005 USA
References
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