Novel Ultrananocrystalline Diamond Probes for High‐Resolution Low‐Wear Nanolithographic Techniques

In the title article by H. D. Espinosa and co-workers published in Issue 8–9 of Small, there was an error in the scale bar of Figure 8; both scale bars should indicate a length of 100 nm, rather than 500 nm. The corrected figure is shown below:8 High-resolution SEM image of a UNCD tip before (a) and after (b) a prolonged wear test. The absence of portions of the material roughly following the intercluster contour line suggests that failure happens mainly by detaching of clusters, rather than by continuous smooth wear.