A Combined Top‐down and Bottom‐up approach for Precise Placement of Metal Nanoparticles on Silicon

W. K. Choi; T. H. Liew; H. G. Chew; F. Zheng; C. V. Thompson; Y. Wang; M. H. Hong; X. D. Wang; L. Li; J. Yun

doi:10.1002/smll.200800395

journal article·2008-04Open access

A Combined Top‐down and Bottom‐up approach for Precise Placement of Metal Nanoparticles on Silicon

W. K. Choi, T. H. Liew, H. G. Chew, F. Zheng, C. V. Thompson, Y. Wang, M. H. Hong, X. D. Wang, L. Li, J. Yun

Small· Volume 4· Issue 4

Publisher page Open full text

Source abstract

Abstract

10.1002/smll.200700728 In the Communication by W. K. Choi et al. published in Issue 3/2008 of Small, the full name of one of the authors was given incorrectly; the correct name is Liang Li.

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

Nanomaterials

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis · Anodic Oxide Films and Nanostructures

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References

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