Cross‐Sectional Characterization of Electrodeposited, Monocrystalline Au Nanowires in Parallel Arrangement
Source abstract
Abstract
Cross-sections of cylindrically shaped nanowires are fabricated using a focused ion beam technique. They are oriented such that the electron beam direction is parallel to a low-index zone axis for high- resolution imaging. In this configuration the direction of gold nanowire growth can be determined using electron diffraction.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Anodic Oxide Films and Nanostructures · Advanced Electron Microscopy Techniques and Applications · Surface and Thin Film Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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