Doping Ability Modulated by Interlayer Coupling in AA′ and AB Stacked Bilayer V–WS ₂ Grown with Chemical Vapor Deposition

Abstract Doping in transition metal dichalcogenide (TMD) has received extensive attention for its prospect in the application of photoelectric devices. Currently researchers focus on the doping ability and doping distribution in monolayer TMD and have obtained a series of achievements. Bilayer TMD has more excellent properties compared with monolayer TMD. Moreover, bilayer TMD with different stacking structures presents varying performance due to the difference in interlayer coupling. Herein, this work focuses on doping ability of dopants in different bilayer stacking structures that has not been studied yet. Results of this work show that the doping ability of V atoms in bilayer AA′ and AB stacked WS ₂ is different, and the doping concentration of V atoms in AB stacked WS ₂ is higher than in AA′ stacked WS ₂ . Moreover, dopants from top and bottom layer can be distinguished by scanning transmission electron microscopy (STEM) image. Density functional theory (DFT) calculation further confirms the doping rule. This study reveals the mechanism of the different doping ability caused by stacking structures in bilayer TMD and lays a foundation for further preparation of controllable‐doping bilayer TMD materials.