Atomic Fingerprinting of Heteroatoms Using Noncontact Atomic Force Microscopy
Source abstract
Abstract
Abstract Immense strides have been made in increasing the resolution of scanning probe microscopy. Noncontact atomic force microscopy (nc‐AFM) now offers one the ability to characterize and visualize single molecules with subatomic resolution. Specifically, nc‐AFM with a carbon monoxide (CO) functionalized tip has the ability to discriminate functional groups (–CC–, –CH2, –CO, …), although discriminating atomic species often remains as an ongoing challenge. Here, real‐space pseudopotentials constructed within density functional theory are employed to accurately simulate nc‐AFM images of molecules containing heteroatoms (S, I, and N) within dibenzothiophene (DBT), 2‐iodotriphenylene (ITP), acridine (ACR) and ferrous phthalocyanine (FePc). It is found that S and I atoms can be easily identified from C based on their unique features. For N atoms, a use of tip functionalization is proposed to effectively discriminate them from C atoms.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Mechanical and Optical Resonators · Molecular Junctions and Nanostructures
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
McKetta Department of Chemical Engineering The University of Texas at Austin POB 4.302, 201 East 24th St. C0200 Austin TX 78712 USA
McKetta Department of Chemical Engineering Department of Physics Center for Computational Materials Oden Institute for Computational Engineering and Sciences The University of Texas at Austin POB 4.324 201 East 24th St. C0200 Austin TX 78712 USA
Funding
U.S. Department of Energy
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