Nanoscale Magnetic Characterization of Tunneling Magnetoresistance Spin Valve Head by Electron Holography
Source abstract
Abstract
Abstract Nanostructured magnetic materials play an important role in increasing miniaturized devices. For the studies of their magnetic properties and behaviors, nanoscale imaging of magnetic field is indispensible. Here, using electron holography, the magnetization distribution of a TMR spin valve head of commercial design is investigated without and with a magnetic field applied. Characterized is the magnetic flux distribution in complex hetero‐nanostructures by averaging the phase images and separating their component magnetic vectors and electric potentials. The magnetic flux densities of the NiFe (shield and 5 nm‐free layers) and the CoPt (20 nm‐bias layer) are estimated to be 1.0 T and 0.9 T, respectively. The changes in the magnetization distribution of the shield, bias, and free layers are visualized in situ for an applied field of 14 kOe. This study demonstrates the promise of electron holography for characterizing the magnetic properties of hetero‐interfaces, nanostructures, and catalysts.
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Research context
OpenAlex topics: Magnetic properties of thin films · Advanced Electron Microscopy Techniques and Applications · Quantum and electron transport phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (26)
Show source-provided references
1. Fert A. · 2007 · 92
2. 10.1038/nmat202410.1038/nmat2024 ↗
3. 10.1063/1.34825210.1063/1.348252 ↗
4. 10.1103/PhysRevLett.74.327310.1103/PhysRevLett.74.3273 ↗
5. 10.1016/0304-8853(95)90001-210.1016/0304-8853(95)90001-2 ↗
6. 10.1063/1.36165310.1063/1.361653 ↗
7. Hubert A. · 1998
8. 10.1016/j.jmmm.2004.10.04810.1016/j.jmmm.2004.10.048 ↗
9. 10.1126/science.106530010.1126/science.1065300 ↗
10. 10.1126/science.109506810.1126/science.1095068 ↗
11. 10.1021/nl102861e10.1021/nl102861e ↗
12. 10.1063/1.194351110.1063/1.1943511 ↗
13. 10.1063/1.290958110.1063/1.2909581 ↗
14. 10.1021/nl900800q10.1021/nl900800q ↗
15. 10.1063/1.335821910.1063/1.3358219 ↗
16. Graef M. D. · 2001
17. 10.1021/nl902024h10.1021/nl902024h ↗
18. 10.1021/nl103310710.1021/nl1033107 ↗
19. 10.1380/ejssnt.2008.2910.1380/ejssnt.2008.29 ↗
20. 10.1063/1.171515510.1063/1.1715155 ↗
21. 10.1007/978-3-540-37204-2_610.1007/978-3-540-37204-2_6 ↗
22. 10.1007/978-1-4615-4817-110.1007/978-1-4615-4817-1 ↗
23. 10.1007/978-4-431-66988-310.1007/978-4-431-66988-3 ↗
24. To obtain better contrast of inteference fringes applicable to materials of heavy elements without losing the spatial resolution increasing the acceleration voltage of microscope used (for example 1000 kV) will be the most effective due to its higher electron transmission capability.
25. Hirata K. · J. Electron Microsc. · 2012
26. 10.1107/S056773946800075610.1107/S0567739468000756 ↗