journal article·2022-05Open access

Ingrained: An Automated Framework for Fusing Atomic‐Scale Image Simulations into Experiments

Eric Schwenker, Venkata Surya Chaitanya Kolluru, Jinglong Guo, Rui Zhang, Xiaobing Hu, Qiucheng Li, Joshua T. Paul, Mark C. Hersam, Vinayak P. Dravid, Robert Klie, Jeffrey R. Guest, Maria K. Y. Chan

Small· Volume 18· Issue 19

Abstract

Abstract To fully leverage the power of image simulation to corroborate and explain patterns and structures in atomic resolution microscopy, an initial correspondence between the simulation and experimental image must be established at the outset of further high accuracy simulations or calculations. Furthermore, if simulation is to be used in context of highly automated processes or high‐throughput optimization, the process of finding this correspondence itself must be automated. In this work, “ingrained,” an open‐source automation framework which solves for this correspondence and fuses atomic resolution image simulations into the experimental images to which they correspond, is introduced. Herein, the overall “ingrained” workflow, focusing on its application to interface structure approximations, and the development of an experimentally rationalized forward model for scanning tunneling microscopy simulation are described.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques · Force Microscopy Techniques and Applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Center for Nanoscale Materials Argonne National Laboratory Lemont IL 60439 USA

Department of Materials Science and Engineering Northwestern University Evanston IL 60208 USA

Department of Materials Science and Engineering University of Florida Gainesville FL 32611 USA

Department of Physics University of Illinois Chicago Chicago IL 60607 USA

Funding

Office of Science · Division of Materials Research

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