journal article·2017-02-28Open access

High-Density 3D-Boron Nitride and 3D-Graphene for High-Performance Nano–Thermal Interface Material

Manuela Loeblein, Siu Hon Tsang, Matthieu Pawlik, Eric Jian Rong Phua, Han Yong, Xiao Wu Zhang, Chee Lip Gan, Edwin Hang Tong Teo

ACS Nano· Volume 11· Issue 2

Abstract

Compression studies on three-dimensional foam-like graphene and h-BN (3D-C and 3D-BN) revealed their high cross-plane thermal conductivity (62–86 W m –1 K –1 ) and excellent surface conformity, characteristics essential for thermal management needs. Comparative studies to state-of-the-art materials and other materials currently under research for heat dissipation revealed 3D-foam’s improved performance (20–30% improved cooling, temperature decrease by Δ T of 44–24 °C).
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Thermal properties of materials · Graphene research and applications · Thermal Radiation and Cooling Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

CNRS-International NTU Thales Research Alliance (CINTRA) UMI 3288, Research Techno Plaza, 50 Nanyang Drive, Singapore 637553, Singapore

Institute of Microelectronics, Agency for Science, Technology and Research (A*Star), 11 Science Park Road, Singapore 117685, Singapore

Temasek Laboratories@NTU, 50 Nanyang Avenue, Singapore 639798, Singapore

Funding

Ministry of Education - Singapore

References (77)

Show source-provided references
1. http://www.businesswire.com/news/home/20151216005646/en/IDTechEx-Research-More-than-Moore-electronics-packaging, retrieved December 16, 2015.
2. Tong X. C. · 2011 · 3010.1007/978-1-4419-7759-5 ↗
3. Viswanath R. · Intel Technol. J. · 2000 · 3
4. 10.1109/JPROC.2006.87979610.1109/JPROC.2006.879796 ↗
5. Schulz M. · PCIM, Nürnberg · 2011 · 2011
6. Prasher R. · 2009 · 43710.1007/978-0-387-78219-5_13 ↗
7. 10.1016/0040-6090(74)90033-910.1016/0040-6090(74)90033-9 ↗
8. Green R. E. · 1992 · 24
9. Farhad, S.; Whalley, D. C.; Conway, P. P.InThermal Interface Materials - A Review of the State of the Art; Electronics Systemintegration Technology Conference, 2006; Sept. 5–7, 2006; 2006; pp2006, 1292–1302.10.1109/ESTC.2006.280178 ↗
10. Liu, J.; Michel, B.; Rencz, M.; Tantolin, C.; Sarno, C.; Miessner, R.; Schuett, K.V.; Tang, X.; Demoustier, S.; Ziaei, A.InRecent progress of thermal interface material research-an overview, 14th International Workshop on Thermal Inveatigation of ICs and Systems, 2008. THERMINIC 2008. 2008; IEEE, pp156–162.10.1109/THERMINIC.2008.4669900 ↗
11. 10.1016/j.mser.2006.01.00110.1016/j.mser.2006.01.001 ↗
12. 10.1002/pen.2170510.1002/pen.21705 ↗
13. 10.1002/app.3267310.1002/app.32673 ↗
14. 10.1109/MEI.2011.595406410.1109/MEI.2011.5954064 ↗
15. 10.1016/j.mattod.2014.04.00310.1016/j.mattod.2014.04.003 ↗
16. 10.1063/1.368717310.1063/1.3687173 ↗
17. King J. · 1988
18. 10.1109/JPROC.2006.87980110.1109/JPROC.2006.879801 ↗
19. http://www.extremetech.com/extreme/222590-an-end-to-scaling-intels-next-generation-chips-will-sacrifice-speed-to-reduce-power, retrieved May 20, 2016.
20. https://www.pugetsystems.com/labs/articles/Impact-of-Temperature-on-Intel-CPU-Performance-606/, retrieved May 20, 2016.
21. http://www.anandtech.com/show/9550/understanding-intels-dynamic-power-and-thermal-framework-smarter-throttling, retrieved May 20, 2016.
22. 10.1109/TCAPT.2008.200119710.1109/TCAPT.2008.2001197 ↗
23. 10.1115/1.403160210.1115/1.4031602 ↗
24. 10.1038/nmat300110.1038/nmat3001 ↗
25. 10.1021/nl401308v10.1021/nl401308v ↗
26. 10.1016/j.carbon.2013.05.01410.1016/j.carbon.2013.05.014 ↗
27. 10.1002/adfm.20150099010.1002/adfm.201500990 ↗
28. 10.1021/nl300662q10.1021/nl300662q ↗
29. 10.1002/adma.20120419610.1002/adma.201204196 ↗
30. 10.1002/smll.20140029210.1002/smll.201400292 ↗
31. 10.1002/smll.20150267010.1002/smll.201502670 ↗
32. 10.1016/j.carbon.2013.08.05910.1016/j.carbon.2013.08.059 ↗
33. 10.1038/ncomms182810.1038/ncomms1828 ↗
34. 10.1103/PhysRevLett.97.18740110.1103/PhysRevLett.97.187401 ↗
35. 10.1016/j.tca.2009.04.01910.1016/j.tca.2009.04.019 ↗
36. 10.1021/nl203906r10.1021/nl203906r ↗
37. 10.1021/nn901876210.1021/nn9018762 ↗
38. 10.1103/PhysRevB.84.08540910.1103/PhysRevB.84.085409 ↗
39. 10.1103/PhysRevB.84.15542110.1103/PhysRevB.84.155421 ↗
40. 10.1103/PhysRevB.86.07540310.1103/PhysRevB.86.075403 ↗
41. 10.1063/1.131022310.1063/1.1310223 ↗
42. 10.1103/PhysRevB.13.460710.1103/PhysRevB.13.4607 ↗
43. 10.1088/0022-3719/4/13/02110.1088/0022-3719/4/13/021 ↗
44. Delhaes P. · 2000 · 110.1201/9781482296921 ↗
45. 10.1016/j.carbon.2011.10.02610.1016/j.carbon.2011.10.026 ↗
46. 10.1002/adma.20140095110.1002/adma.201400951 ↗
47. 10.1021/nn500134m10.1021/nn500134m ↗
48. 10.1002/anie.20120168910.1002/anie.201201689 ↗
49. 10.1021/acs.chemmater.5b0418710.1021/acs.chemmater.5b04187 ↗
50. 10.1002/cphc.20140281410.1002/cphc.201402814 ↗
51. 10.1021/nl501996v10.1021/nl501996v ↗
52. 10.1021/cm501473t10.1021/cm501473t ↗
53. 10.1002/smll.20150217310.1002/smll.201502173 ↗
54. 10.1039/b924997d10.1039/b924997d ↗
55. 10.1016/j.jnucmat.2010.09.03210.1016/j.jnucmat.2010.09.032 ↗
56. 10.1016/j.ijheatmasstransfer.2005.09.03910.1016/j.ijheatmasstransfer.2005.09.039 ↗
57. 10.1109/TCAPT.2006.87587610.1109/TCAPT.2006.875876 ↗
58. Xu, J.; Fisher, T. S.Enhancement of thermal interface conductivities with carbon nanotube arrays. US Patent 8,093,715, 2012.
59. 10.1088/0957-4484/19/21/21570610.1088/0957-4484/19/21/215706 ↗
60. Culham, J.; Teertstra, P.; Savija, I.; Yovanovich, M.InDesign, assembly and commissioning of a test apparatus for characterizing thermal interface materials, The Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, 2002. ITHERM 2002. 2002; IEEE, pp128–135.
61. 10.1149/1.212979610.1149/1.2129796 ↗
62. Draney, N. R.; Liu, J. J.; Jiang, T.InExperimental investigation of bare silicon wafer warp; IEEE Workshop on Microelectronics and Electron Devices, 2004; 2004; IEEE, pp120–123.10.1109/WMED.2004.1297371 ↗
63. 10.1016/j.applthermaleng.2012.06.01310.1016/j.applthermaleng.2012.06.013 ↗
64. Goel, N.; Anoop, T.; Bhattacharya, A.; Cervantes, J.; Mongia, R. K.; Machiroutu, S. V.; Lin, H.L.; Huang, Y.C.; Fan, K.C.; Denq, B.L.InTechnical review of characterization methods for thermal interface materials (TIM); 11th Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008; 2008; IEEE, pp248–258.10.1109/ITHERM.2008.4544277 ↗
65. Vieira C. · Rev. Mater. · 2005 · 10 · 526
66. 10.1039/c3cy00869j10.1039/c3cy00869j ↗
67. 10.1021/j100129a00110.1021/j100129a001 ↗
68. 10.1039/b505330g10.1039/b505330g ↗
69. Tummala R. R. · 2001
70. 10.1063/1.34754410.1063/1.347544 ↗
71. 10.1109/TCPMT.2014.231158710.1109/TCPMT.2014.2311587 ↗
72. Lau J. H. · 2011 · 15 · 23
73. Hoe, Y. Y. G.; Yue, T. G.; Damaruganath, P.; Chong, C. T.; Lau, J. H.; Xiaowu, Z.; Vaidyanathan, K.InEffect of TSV interposer on the thermal performance of FCBGA package; 11th Electronics Packaging Technology Conference, 2009. EPTC’09; 2009; IEEE, pp778–786.10.1109/EPTC.2009.5416445 ↗
74. Sun, S.; Bao, J.; Mu, W.; Fu, Y.; Zhang, Y.; Ye, L.; Liu, J.InCooling hot spots by hexagonal boron nitride heat spreaders; 65th Electronic Components and Technology Conference (ECTC), 2015; May 26–29, 2015, IEEE, 2015; pp1658–1663.10.1109/ECTC.2015.7159819 ↗
75. 10.1088/0022-3719/18/9/02210.1088/0022-3719/18/9/022 ↗
76. 10.1016/j.tca.2006.11.02610.1016/j.tca.2006.11.026 ↗
77. 10.1109/TCPMT.2014.231158710.1109/TCPMT.2014.2311587 ↗