journal article·2011-11-22

Complex Capacitance Scaling in Ionic Liquids-Filled Nanopores

Peng Wu, Jingsong Huang, Vincent Meunier, Bobby G. Sumpter, Rui Qiao

ACS Nano· Volume 5· Issue 11
Publisher page

Abstract

Recent experiments have shown that the capacitance of subnanometer pores increases anomalously as the pore width decreases, thereby opening a new avenue for developing supercapacitors with enhanced energy density. However, this behavior is still subject to some controversy since its physical origins are not well understood. Using atomistic simulations, we show that the capacitance of slit-shaped nanopores in contact with room-temperature ionic liquids exhibits a U-shaped scaling behavior in pores with widths from 0.75 to 1.26 nm. The left branch of the capacitance scaling curve directly corresponds to the anomalous capacitance increase and thus reproduces the experimental observations. The right branch of the curve indirectly agrees with experimental findings that so far have received little attention. The overall U-shaped scaling behavior provides insights on the origins of the difficulty in experimentally observing the pore-width-dependent capacitance. We establish a theoretical framework for understanding the capacitance of electrical double layers in nanopores and provide mechanistic details into the origins of the observed scaling behavior. The framework highlights the critical role of "ion solvation" in controlling pore capacitance and the importance of choosing anion/cation couples carefully for optimal energy storage in a given pore system.
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Research context

OpenAlex topics: Supercapacitor Materials and Fabrication · Conducting polymers and applications · Ionic liquids properties and applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Mechanical Engineering, Clemson University, Clemson, South Carolina 29634-0921, United States

Center for Nanophase Materials Sciences and Computer Science and Mathematics Division, Oak Ridge National Laboratory, Bethel Valley Road, Oak Ridge, Tennessee 37831-6367, United States

Department of Physics, Applied Physics, and Astronomy, Rensselaer Polytechnic Institute, Troy, New York 12180-3590, United States

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