Secondary electron induced current in scanning transmission electron microscopy: an alternative way to visualize the morphology of nanoparticles
Source abstract
Abstract
Electron tomography (ET) is a powerful tool to determine the three-dimensional (3D) structure of nanomaterials in a transmission electron microscope. However, the acquisition of a conventional tilt series for ET is a time-consuming process and can therefore not provide 3D structural information in a time-efficient manner. Here, we propose surface-sensitive secondary electron (SE) imaging as an alternative to ET for the investigation of the morphology of nanomaterials. We use the SE electron beam induced current (SEEBIC) technique that maps the electrical current arising from holes generated by the emission of SEs from the sample. SEEBIC imaging can provide valuable information on the sample morphology with high spatial resolution and significantly shorter throughput times compared with ET. In addition, we discuss the contrast formation mechanisms that aid in the interpretation of SEEBIC data.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
EMAT and NANOlab Center of Excellence, University of Antwerp, 2020 Antwerp, Belgium
CIC biomaGUNE, Basque Research and Technology Alliance (BRTA), 20014 Donostia-San Sebastián, Spain
Centro de Investigación Biomédica en Red, Bioingeniería, Biomateriales y Nanomedicina (CIBER-BBN), 20014 Donostia-San Sebastián, Spain
Ikerbasque, Basque Foundation for Science, 48009 Bilbao, Spain
CINBIO, University of Vigo, 36310 Vigo, Spain
Funding
Ministerio de Ciencia e Innovaci?n · H2020 Future and Emerging Technologies · H2020 European Research Council
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