Application of dynamic impedance spectroscopy to atomic force microscopy
Source abstract
Abstract
Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials. It is useful to combine those techniques to obtain the spatial distribution of an impedance vector. This paper proposes a new combining approach utilizing multifrequency scanning and simultaneous AFM scanning of an investigated surface.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Near-Field Optical Microscopy · Mechanical and Optical Resonators
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (33)
Show source-provided references
1. 10.1103/PhysRevLett.56.93010.1103/PhysRevLett.56.930 ↗
2. Stark R W · Eur. Biophys. J. · 2003 · 32 · 3310.1007/s00249-002-0270-y ↗
3. 10.1016/S0304-3991(99)00136-910.1016/S0304-3991(99)00136-9 ↗
4. 10.1016/S0165-022X(01)00165-810.1016/S0165-022X(01)00165-8 ↗
5. 10.1016/j.stam.2006.06.00710.1016/j.stam.2006.06.007 ↗
6. 10.1007/s10035-002-0122-610.1007/s10035-002-0122-6 ↗
7. 10.1016/j.apsusc.2004.03.25510.1016/j.apsusc.2004.03.255 ↗
8. 10.1016/1359-6462(96)00247-310.1016/1359-6462(96)00247-3 ↗
9. 10.1016/j.stam.2006.12.01010.1016/j.stam.2006.12.010 ↗
10. 10.1016/j.stam.2006.04.01610.1016/j.stam.2006.04.016 ↗
11. 10.1088/1367-2630/8/10/23710.1088/1367-2630/8/10/237 ↗
12. Ciureanu M · J. New Mat. Electrochem. Syst. · 2000 · 3 · 107
13. 10.1016/S0167-2738(00)00627-510.1016/S0167-2738(00)00627-5 ↗
14. 10.1016/S0022-0728(96)04965-010.1016/S0022-0728(96)04965-0 ↗
15. 10.1016/0013-4686(95)00434-310.1016/0013-4686(95)00434-3 ↗
16. 10.1021/ac070169w10.1021/ac070169w ↗
17. 10.1016/j.stam.2006.11.00610.1016/j.stam.2006.11.006 ↗
18. 10.1016/j.stam.2006.07.00510.1016/j.stam.2006.07.005 ↗
19. 10.1111/j.1151-2916.2002.tb00571.x10.1111/j.1151-2916.2002.tb00571.x ↗
20. Kalinin S V · Phys. Rev. · 2004 · 70 · 235304 1
21. 10.1063/1.153183310.1063/1.1531833 ↗
22. 10.1063/1.177821710.1063/1.1778217 ↗
23. 10.1063/1.173704710.1063/1.1737047 ↗
24. QuianS 2002 Introduction to Time Frequency and Wavelet Transforms Upper Saddle River, NJ Prentice-Hall PTR p 51
25. 10.1016/S0022-0728(00)00110-810.1016/S0022-0728(00)00110-8 ↗
26. 10.1016/S0022-0728(00)00111-X10.1016/S0022-0728(00)00111-X ↗
27. 10.1016/S0022-0728(03)00154-210.1016/S0022-0728(03)00154-2 ↗
28. 10.1016/j.electacta.2003.09.03010.1016/j.electacta.2003.09.030 ↗
29. GiannakisG B 1998 The Digital Signal Processing Handbook W KMadisetti D BWilliams Boca Raton, FL CRC Press p 17.1
30. 10.1002/0471716243.ch110.1002/0471716243.ch1 ↗
31. CarmonaRHwangW-LTorresamiB 1998 Practical Time-Frequency Analysis San Diego Academic p 101
32. 10.1007/978-3-7091-2620-2_210.1007/978-3-7091-2620-2_2 ↗
33. 10.1016/j.stam.2005.10.00310.1016/j.stam.2005.10.003 ↗